Elimination of phase noise of pulsed laser diodes in electrooptic sampling systems

The multimode operation of pulsed laser diode sources is converted into excess noise in electrooptic probing systems for electrical waveforms and prevents measurements with shot-noise-limited sensitivity. The transfer function of the sampling system is determined and analyzed in terms of the wavelen...

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Bibliographic Details
Published in:IEEE journal of quantum electronics 1993-04, Vol.29 (4), p.1022-1026
Main Authors: Baur, G., Solkner, G., Glockle, W.G., Pfleiderer, H.-J.
Format: Article
Language:English
Subjects:
Applied sciences
Diode lasers
Electric variables measurement
Electronics
Exact sciences and technology
Noise measurement
Optical noise
Optical pulses
Phase noise
Pulse measurements
Testing, measurement, noise and reliability
Transfer functions
Voltage
Wavelength measurement
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Summary:The multimode operation of pulsed laser diode sources is converted into excess noise in electrooptic probing systems for electrical waveforms and prevents measurements with shot-noise-limited sensitivity. The transfer function of the sampling system is determined and analyzed in terms of the wavelength and electric field dependence. It is shown that by proper orientation of the polarizing components within the optical beam path, points of operation can by found which have both a vanishing wavelength dependence of the transfer function and maximum sensitivity to the electric fields to be measured. Excess noise sources due to wavelength fluctuations of the laser are thus eliminated, and shot-noise-limited voltage resolution is obtained. The system has been optimized to yield a voltage sensitivity of 2.3 mV/ square root Hz for a longitudinal LiNbO/sub 3/ probe crystal.< >
ISSN:0018-9197
1558-1713
DOI:10.1109/3.214484