Raman scattering and X-ray diffractometry studies of epitaxial TiO sub 2 and VO sub 2 thin films and multilayers on alpha -Al sub 2 O sub 3 (11 minus 20)

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Bibliographic Details
Published in:Journal of applied physics 1993-01, Vol.73 (6), p.2841-2847
Main Authors: Foster, C M, Chiarello, R P, Chang, H L M, You, H, Zhang, T J, Frase, H
Format: Article
Language:English
Online Access:Get full text
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Summary:Title describes article content. 27 refs.
ISSN:0021-8979