Measurement of L X-ray intensity ratios in tantalum by proton and Si-ion impact

• Published in: Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms Beam interactions with materials and atoms, 1996-04, Vol.111 (1), p.22-26
• Main Authors: Braich, J.S., Goyal, D.P., Mandal, A., Dhal, B.B., Singh, B.P., Padhi, H.C., Khurana, C.S., Verma, H.R.
• Format: Article
• Language: English
• ISSN: 0168-583X; 1872-9584
• DOI: 10.1016/0168-583X(95)01299-0

The Lι, L β 1,4,6, L β 2,15,3, L γ 1, L γ 2,3,6 and L γ 4,4′, X-ray intensities relative to the Lα, caused by the impact of protons of energy 1 to 4.6 MeV and Si-ions of 70 to 98 MeV on Ta targets, have been measured. The results show that the intensity ratios drop significantly for all transitions except Lγ 2,3,6 Lα with Si-ions of the same energy/amu as compared to those of protons. The experimental results have been compared with those based on the ECPSSR theoretical values. From the energy shift and change in the intensity ratios of various transitions caused by Si-ion impact, the number of outer shell vacancies in the M, N and O-shells simultaneous to that of L-shell have been estimated.