Loading…

AES studies of active intrachannel surface in microchannel plates

The chemical composition of internal active glassy layers of the channels is responsible for the performance of the microchannel plates (MCP). A detailed account will be given of the performed work, using Auger electron spectroscopy (AES). To know the essential differences in the elemental distribut...

Full description

Saved in:
Bibliographic Details
Published in:Applied surface science 1993-01, Vol.70 (1-4), p.169-171
Main Authors: Praček, B., Kern, M.
Format: Article
Language:English
Subjects:
Citations: Items that this one cites
Items that cite this one
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
cited_by cdi_FETCH-LOGICAL-c310t-61e5699f518144ab2cdd5cd45b1d949f76dc5d639ae91436fce138f4f0ff8afb3
cites cdi_FETCH-LOGICAL-c310t-61e5699f518144ab2cdd5cd45b1d949f76dc5d639ae91436fce138f4f0ff8afb3
container_end_page 171
container_issue 1-4
container_start_page 169
container_title Applied surface science
container_volume 70
creator Praček, B.
Kern, M.
description The chemical composition of internal active glassy layers of the channels is responsible for the performance of the microchannel plates (MCP). A detailed account will be given of the performed work, using Auger electron spectroscopy (AES). To know the essential differences in the elemental distribution of the glassy layers inside the channels of the fresh and aged MCP, depth profiling through the about 60 nm thick channel wall was applied. This method gives the possibility to establish various glass constituents and to follow their ionic transport phenomena as a result of the ageing process.
doi_str_mv 10.1016/0169-4332(93)90420-G
format article
fullrecord <record><control><sourceid>proquest_cross</sourceid><recordid>TN_cdi_proquest_miscellaneous_26229764</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><els_id>016943329390420G</els_id><sourcerecordid>55371</sourcerecordid><originalsourceid>FETCH-LOGICAL-c310t-61e5699f518144ab2cdd5cd45b1d949f76dc5d639ae91436fce138f4f0ff8afb3</originalsourceid><addsrcrecordid>eNqFkE1LAzEQQIMoWKv_wMMeRPSwmu9uLkIptQoFD-o5pMkEI9vdmuwK_nuztvaoh2Fg5s0M8xA6J_iGYCJvc6iSM0avFLtWmFNcLg7QiFQTVgpR8UM02iPH6CSld4wJzd0Rmk7nz0XqehcgFa0vjO3CJxSh6aKxb6ZpoC5SH72xQ7FYBxvb3_qmNh2kU3TkTZ3gbJfH6PV-_jJ7KJdPi8fZdFlaRnBXSgJCKuUFqQjnZkWtc8I6LlbEKa78RDornGTKgCKcSW-BsMpzj72vjF-xMbrc7t3E9qOH1Ol1SBbq2jTQ9klTSamaSP4vSGQmxYRkkG_B_FNKEbzexLA28UsTrAexerCmB2taMf0jVi_y2MVuv0nW1D6axoa0n-WUclpVGbvbYpClfAaIOtkAjQUXIthOuzb8fecbriKL8Q</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>16622571</pqid></control><display><type>article</type><title>AES studies of active intrachannel surface in microchannel plates</title><source>Backfile Package - Materials Science [YMS]</source><source>Backfile Package - Physics General (Legacy) [YPA]</source><creator>Praček, B. ; Kern, M.</creator><creatorcontrib>Praček, B. ; Kern, M.</creatorcontrib><description>The chemical composition of internal active glassy layers of the channels is responsible for the performance of the microchannel plates (MCP). A detailed account will be given of the performed work, using Auger electron spectroscopy (AES). To know the essential differences in the elemental distribution of the glassy layers inside the channels of the fresh and aged MCP, depth profiling through the about 60 nm thick channel wall was applied. This method gives the possibility to establish various glass constituents and to follow their ionic transport phenomena as a result of the ageing process.</description><identifier>ISSN: 0169-4332</identifier><identifier>EISSN: 1873-5584</identifier><identifier>DOI: 10.1016/0169-4332(93)90420-G</identifier><language>eng</language><publisher>Amsterdam: Elsevier B.V</publisher><subject>Applied sciences ; Electronics ; Exact sciences and technology ; Imaging devices ; Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices</subject><ispartof>Applied surface science, 1993-01, Vol.70 (1-4), p.169-171</ispartof><rights>1993</rights><rights>1994 INIST-CNRS</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c310t-61e5699f518144ab2cdd5cd45b1d949f76dc5d639ae91436fce138f4f0ff8afb3</citedby><cites>FETCH-LOGICAL-c310t-61e5699f518144ab2cdd5cd45b1d949f76dc5d639ae91436fce138f4f0ff8afb3</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://www.sciencedirect.com/science/article/pii/016943329390420G$$EHTML$$P50$$Gelsevier$$H</linktohtml><link.rule.ids>309,310,314,780,784,789,790,3553,3630,23928,23929,25138,27922,27923,46002,46010</link.rule.ids><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&amp;idt=4224288$$DView record in Pascal Francis$$Hfree_for_read</backlink></links><search><creatorcontrib>Praček, B.</creatorcontrib><creatorcontrib>Kern, M.</creatorcontrib><title>AES studies of active intrachannel surface in microchannel plates</title><title>Applied surface science</title><description>The chemical composition of internal active glassy layers of the channels is responsible for the performance of the microchannel plates (MCP). A detailed account will be given of the performed work, using Auger electron spectroscopy (AES). To know the essential differences in the elemental distribution of the glassy layers inside the channels of the fresh and aged MCP, depth profiling through the about 60 nm thick channel wall was applied. This method gives the possibility to establish various glass constituents and to follow their ionic transport phenomena as a result of the ageing process.</description><subject>Applied sciences</subject><subject>Electronics</subject><subject>Exact sciences and technology</subject><subject>Imaging devices</subject><subject>Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices</subject><issn>0169-4332</issn><issn>1873-5584</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>1993</creationdate><recordtype>article</recordtype><recordid>eNqFkE1LAzEQQIMoWKv_wMMeRPSwmu9uLkIptQoFD-o5pMkEI9vdmuwK_nuztvaoh2Fg5s0M8xA6J_iGYCJvc6iSM0avFLtWmFNcLg7QiFQTVgpR8UM02iPH6CSld4wJzd0Rmk7nz0XqehcgFa0vjO3CJxSh6aKxb6ZpoC5SH72xQ7FYBxvb3_qmNh2kU3TkTZ3gbJfH6PV-_jJ7KJdPi8fZdFlaRnBXSgJCKuUFqQjnZkWtc8I6LlbEKa78RDornGTKgCKcSW-BsMpzj72vjF-xMbrc7t3E9qOH1Ol1SBbq2jTQ9klTSamaSP4vSGQmxYRkkG_B_FNKEbzexLA28UsTrAexerCmB2taMf0jVi_y2MVuv0nW1D6axoa0n-WUclpVGbvbYpClfAaIOtkAjQUXIthOuzb8fecbriKL8Q</recordid><startdate>19930101</startdate><enddate>19930101</enddate><creator>Praček, B.</creator><creator>Kern, M.</creator><general>Elsevier B.V</general><general>Elsevier Science</general><scope>IQODW</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SP</scope><scope>7U5</scope><scope>8FD</scope><scope>L7M</scope></search><sort><creationdate>19930101</creationdate><title>AES studies of active intrachannel surface in microchannel plates</title><author>Praček, B. ; Kern, M.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c310t-61e5699f518144ab2cdd5cd45b1d949f76dc5d639ae91436fce138f4f0ff8afb3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>1993</creationdate><topic>Applied sciences</topic><topic>Electronics</topic><topic>Exact sciences and technology</topic><topic>Imaging devices</topic><topic>Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Praček, B.</creatorcontrib><creatorcontrib>Kern, M.</creatorcontrib><collection>Pascal-Francis</collection><collection>CrossRef</collection><collection>Electronics &amp; Communications Abstracts</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>Technology Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>Applied surface science</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Praček, B.</au><au>Kern, M.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>AES studies of active intrachannel surface in microchannel plates</atitle><jtitle>Applied surface science</jtitle><date>1993-01-01</date><risdate>1993</risdate><volume>70</volume><issue>1-4</issue><spage>169</spage><epage>171</epage><pages>169-171</pages><issn>0169-4332</issn><eissn>1873-5584</eissn><abstract>The chemical composition of internal active glassy layers of the channels is responsible for the performance of the microchannel plates (MCP). A detailed account will be given of the performed work, using Auger electron spectroscopy (AES). To know the essential differences in the elemental distribution of the glassy layers inside the channels of the fresh and aged MCP, depth profiling through the about 60 nm thick channel wall was applied. This method gives the possibility to establish various glass constituents and to follow their ionic transport phenomena as a result of the ageing process.</abstract><cop>Amsterdam</cop><pub>Elsevier B.V</pub><doi>10.1016/0169-4332(93)90420-G</doi><tpages>3</tpages></addata></record>
fulltext fulltext
identifier ISSN: 0169-4332
ispartof Applied surface science, 1993-01, Vol.70 (1-4), p.169-171
issn 0169-4332
1873-5584
language eng
recordid cdi_proquest_miscellaneous_26229764
source Backfile Package - Materials Science [YMS]; Backfile Package - Physics General (Legacy) [YPA]
subjects Applied sciences
Electronics
Exact sciences and technology
Imaging devices
Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices
title AES studies of active intrachannel surface in microchannel plates
url http://sfxeu10.hosted.exlibrisgroup.com/loughborough?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-13T22%3A13%3A54IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=AES%20studies%20of%20active%20intrachannel%20surface%20in%20microchannel%20plates&rft.jtitle=Applied%20surface%20science&rft.au=Pra%C4%8Dek,%20B.&rft.date=1993-01-01&rft.volume=70&rft.issue=1-4&rft.spage=169&rft.epage=171&rft.pages=169-171&rft.issn=0169-4332&rft.eissn=1873-5584&rft_id=info:doi/10.1016/0169-4332(93)90420-G&rft_dat=%3Cproquest_cross%3E55371%3C/proquest_cross%3E%3Cgrp_id%3Ecdi_FETCH-LOGICAL-c310t-61e5699f518144ab2cdd5cd45b1d949f76dc5d639ae91436fce138f4f0ff8afb3%3C/grp_id%3E%3Coa%3E%3C/oa%3E%3Curl%3E%3C/url%3E&rft_id=info:oai/&rft_pqid=16622571&rft_id=info:pmid/&rfr_iscdi=true