Surface structure of free-standing polyaniline thin films

The techniques of scanning tunneling microscopy and atomic force microscopy were used to study the structure of chemically prepared free-standing polyaniline thin films in both their protonated and non-protonated forms. Both types of films were largely amorphous, with small regions exhibiting some d...

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Bibliographic Details
Published in:Synthetic metals 1993-10, Vol.60 (3), p.211-214
Main Authors: Porter, T.L., Caple, K., Caple, G.
Format: Article
Language:English
Subjects:
Applied sciences
Exact sciences and technology
Organic polymers
Physicochemistry of polymers
Properties and characterization
Structure, morphology and analysis
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Summary:The techniques of scanning tunneling microscopy and atomic force microscopy were used to study the structure of chemically prepared free-standing polyaniline thin films in both their protonated and non-protonated forms. Both types of films were largely amorphous, with small regions exhibiting some degree of crystalline order in the protonated films. No nanometer-scale bundle structure was observed, in contrast to films prepared by electrochemical means or by direct evaporation in high vacuum.
ISSN:0379-6779
1879-3290
DOI:10.1016/0379-6779(93)91281-6