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Stability of visible luminescence from porous silicon

The stability of the luminescence from porous Si has been improved by rapid thermal oxidation. As-prepared and oxidized samples have been compared by cathodoluminescence and photoluminescence. Electron beam excitation resulted in rapid decay of the porous Si emission from as-prepared samples. Photol...

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Bibliographic Details
Published in:Applied physics letters 1993-05, Vol.62 (21), p.2667-2669
Main Authors: BATSTONE, J. L, TISCHLER, M. A, COLLINS, R. T
Format: Article
Language:English
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Summary:The stability of the luminescence from porous Si has been improved by rapid thermal oxidation. As-prepared and oxidized samples have been compared by cathodoluminescence and photoluminescence. Electron beam excitation resulted in rapid decay of the porous Si emission from as-prepared samples. Photoluminescence measurements from as-prepared samples in oxygen showed a similar degradation. In contrast, the rapid thermal oxidized samples showed a dramatic improvement in stability under either electron beam or photoexcitation.
ISSN:0003-6951
1077-3118
DOI:10.1063/1.109279