High-Resolution Table-Top NEXAFS Spectroscopy

A table-top near-edge X-ray absorption fine structure (NEXAFS) spectroscopy system consisting of a soft X-ray source and an integrated spectrometer with a significantly improved resolution is presented. The soft X-ray source is based on a long-term stable and nearly debris-free picosecond laser-indu...

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Bibliographic Details
Published in:Analytical chemistry (Washington) 2022-03, Vol.94 (8), p.3510-3516
Main Authors: Holburg, Jonathan, Müller, Matthias, Mann, Klaus, Wild, Philip, Eusterhues, Karin, Thieme, Jürgen
Format: Article
Language:English
Subjects:
Absorption spectroscopy
Analytical chemistry
Chemistry
Fine structure
Gas jets
Krypton
Laser plasmas
Nickel
Soft x rays
Spectral resolution
Spectrum analysis
Synchrotrons
Ultrastructure
X ray absorption
X ray sources
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Summary:A table-top near-edge X-ray absorption fine structure (NEXAFS) spectroscopy system consisting of a soft X-ray source and an integrated spectrometer with a significantly improved resolution is presented. The soft X-ray source is based on a long-term stable and nearly debris-free picosecond laser-induced plasma generated in a pulsed krypton gas jet target. Photon energies ranging from 250 to 1000 eV can be used for the absorption spectroscopy of thin samples. The newly designed spectrometer accomplishes a spectral resolution of E/ΔE = 1535 at 430 eV, being close to typical synchrotron setups. Moreover, a simultaneous multi-edge analysis is possible. The performance of the new system is demonstrated by investigating the fine structure of the K- and L-absorption edges of various elements (carbon, calcium, oxygen, iron, nickel, and copper) for different types of samples. An excellent agreement with synchrotron spectra is achieved.
ISSN:0003-2700
1520-6882
DOI:10.1021/acs.analchem.1c04374