Dopant implantation, mixing and diffusion into glasses

Rutherford backscattering spectrometry infrared reflection spectroscopy (IRRS) and scanning electron microscopy were used to study silicate glasses doped with Cu, Ag, P, Si, In and Sb by diffusion, implantation and mixing. The IRRS analysis showed that despite different mechanisms of dopant introduc...

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Bibliographic Details
Published in:Surface & coatings technology 1994-11, Vol.70 (1), p.143-146
Main Authors: Deshkovskaya, A., Kulikauskas, V.S., Komar, V.P., Skornyakov, I.V.
Format: Article
Language:English
Subjects:
Condensed matter: structure, mechanical and thermal properties
Defects and impurities in crystals
microstructure
Doping and impurity implantation in other materials
Exact sciences and technology
Physics
Structure of solids and liquids
crystallography
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Summary:Rutherford backscattering spectrometry infrared reflection spectroscopy (IRRS) and scanning electron microscopy were used to study silicate glasses doped with Cu, Ag, P, Si, In and Sb by diffusion, implantation and mixing. The IRRS analysis showed that despite different mechanisms of dopant introduction into the structural glass network, the glasses have a certain IRRS similarity. The reason for this may be similarity in the structural sites of those atoms they take after their full stop and completing all the processes involved in doping.
ISSN:0257-8972
1879-3347
DOI:10.1016/0257-8972(94)90085-X