100-300 GHz Gunn oscillator simulation through harmonic balance circuit analysis linked to a hydrodynamic device simulator

Accurate and efficient calculations of the large-signal AC behavior of second-harmonic InP transferred electron oscillators (TEOs) are presented. This is accomplished by combining a novel harmonic balance circuit analysis technique with a hydrodynamic device simulator employing the temperature depen...

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Bibliographic Details
Published in:IEEE microwave and guided wave letters 1994-08, Vol.4 (8), p.282-284
Main Authors: Zybura, M.F., Jones, S.H., Tait, G.B., Jones, J.R.
Format: Article
Language:English
Subjects:
Analytical models
Applied sciences
Circuit analysis
Circuit properties
Circuit simulation
Electric, optical and optoelectronic circuits
Electronics
Electrons
Equations
Exact sciences and technology
Gunn devices
Hydrodynamics
Indium phosphide
Iterative algorithms
Microwave circuits, microwave integrated circuits, microwave transmission lines, submillimeter wave circuits
Oscillators
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Summary:Accurate and efficient calculations of the large-signal AC behavior of second-harmonic InP transferred electron oscillators (TEOs) are presented. This is accomplished by combining a novel harmonic balance circuit analysis technique with a hydrodynamic device simulator employing the temperature dependent drift and diffusion equations. The electron transport simulations include a detailed heat flow analysis to update the temperature profile in the device. The nonlinear circuit analysis utilizes a fixed-point iterative method derived from the robust multiple reflection algorithm. To expedite the process and aid in convergence, an acceleration technique is also employed in this algorithm. The associated reduction in computation time allows for the inclusion of a hydrodynamic treatment of the transferred electron device (TED) using the modified drift and diffusion equations. Comparisons are made with the published experimental data reported by Rydberg on second-harmonic 188 GHz InP TEOs.< >
ISSN:1051-8207
1558-2329
DOI:10.1109/75.311499