Spatial light modulator phase depth determination from optical diffraction information

A noninterferometric technique is presented for determining the phase modulating characteristics of spatial light modulators. Examining the far-field diffraction pattern intensity distribution for specific input functions enables the phase modulation to be calculated. Results are compared with usual...

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Bibliographic Details
Published in:Optical Engineering 1996-04, Vol.35 (4), p.951-954
Main Authors: McClain, John L, Erbach, Peter S, Gregory, Don A, Yu, Francis T. S
Format: Article
Language:English
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Summary:A noninterferometric technique is presented for determining the phase modulating characteristics of spatial light modulators. Examining the far-field diffraction pattern intensity distribution for specific input functions enables the phase modulation to be calculated. Results are compared with usual interferometric techniques for a liquid crystal based modulator. ©
ISSN:0091-3286
1560-2303
DOI:10.1117/1.600704