Thin polymer films on rough surfaces

X-ray diffraction measurements in the region of small incidence and exit angles on thin polystyrene (PS) films deposited on laterally structured surfaces are performed. From fits of the data we obtain how the Fourier-components of the substrates are damped by the adsorbed films. The results are comp...

Full description

Saved in:
Bibliographic Details
Published in:Physica. B, Condensed matter Condensed matter, 1996-04, Vol.221 (1), p.53-59
Main Authors: Tolan, M., Vacca, G., Wang, J., Sinha, S.K., Li, Z., Rafailovich, M.H., Sokolov, J., Gibaud, A., Lorenz, H., Kotthaus, J.P.
Format: Article
Language:English
Citations: Items that this one cites
Items that cite this one
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Summary:X-ray diffraction measurements in the region of small incidence and exit angles on thin polystyrene (PS) films deposited on laterally structured surfaces are performed. From fits of the data we obtain how the Fourier-components of the substrates are damped by the adsorbed films. The results are compared with theoretical predictions for liquid films. It turns out that PS-films of low molecular weight (⩽300 k) behave like frozen liquids. Within films of a molecular weight of 1000 k viscoelastic forces dominate over the substrate—adsorbate van der Waals-interactions so that even a 680 Å thick film is not totally flat on top of a grating with a height of 130 Å.
ISSN:0921-4526
1873-2135
DOI:10.1016/0921-4526(95)00904-3