Selective terahertz absorber for angle and polarization-independent spectral sensing

Polarization- and incident-angle-independent narrow-band terahertz (THz) absorbers were developed to enable THz imaging, radar, and spectroscopy applications. The design comprises a transparent fused silica (SiOx) substrate backed by an optically thick metal layer and topped by a periodic array of m...

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Bibliographic Details
Published in:Optics letters 2022-03, Vol.47 (6), p.1514-1516
Main Authors: Arose, Christopher, Terracciano, Anthony C, Peale, Robert E, Vasu, Subith S
Format: Article
Language:English
Subjects:
Absorbers
Absorption spectra
Finite element method
Fourier transforms
Fused silica
Incidence angle
Photolithography
Polarization
Radar imaging
Silicon dioxide
Spectroscopy
Spectrum analysis
Substrates
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Summary:Polarization- and incident-angle-independent narrow-band terahertz (THz) absorbers were developed to enable THz imaging, radar, and spectroscopy applications. The design comprises a transparent fused silica (SiOx) substrate backed by an optically thick metal layer and topped by a periodic array of metal cross patterns. Finite element analysis (FEA) simulations optimized the geometry of devices fabricated by contact photolithography. Resonances were characterized by Fourier-transform reflectance spectroscopy. The design tunable absorption bands appeared in the range 50-200 cm (1.5-6 THz) with full widths at half maximum of 20-56 cm (0.6-1.68 THz). Maximum absorption was -8.5 to -16.8 dB. The absorption bands are independent of incidence angle and polarization in agreement with simulation.
ISSN:0146-9592
1539-4794
DOI:10.1364/OL.449308