Logical diagnosis solutions must drive yield improvement

The author discusses automated production-worthy solutions for high-volume manufacturing. He suggests that Design for Test (DFT) techniques such as scan (particularly full scan) provide design hooks that enable more effective solutions, while advances in realistic defect behavior modeling and simula...

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Bibliographic Details
Main Author: Ryan, P.G.
Format: Conference Proceeding
Language:English
Subjects:
Costs
Fading
Failure analysis
Geometry
Logic testing
Manufacturing
Production
Silicon
Stress
Throughput
Online Access:Request full text
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Description
Summary:The author discusses automated production-worthy solutions for high-volume manufacturing. He suggests that Design for Test (DFT) techniques such as scan (particularly full scan) provide design hooks that enable more effective solutions, while advances in realistic defect behavior modeling and simulation are improving both the accuracy and the ability to localize more difficult defect types. Given a real commitment and a significant investment in research and development, the logic diagnosis problem is promising.
ISSN:1089-3539
2378-2250
DOI:10.1109/TEST.1997.639647