Phase segregation in vapour-deposited Co-Cr magnetic thin films, observed by X-ray absorption fine structure spectroscopy

X-ray absorption fine structure spectroscopy has been applied to study atomic short-range order in Co 74Cr 28 magnetic thin films. The obtained results can only be understood in the frame of a suggested microphase segregation into regions with different stoichiometries. The disorder around Cr atoms...

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Bibliographic Details
Published in:Thin solid films 1994-02, Vol.238 (2), p.184-190
Main Authors: Kizler, P., Hagemeyer, A., Hibst, H.
Format: Article
Language:English
Subjects:
Applied sciences
Condensed matter: structure, mechanical and thermal properties
Exact sciences and technology
Metals. Metallurgy
Physics
Structure and morphology
thickness
Surfaces and interfaces
thin films and whiskers (structure and nonelectronic properties)
Thin film structure and morphology
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Summary:X-ray absorption fine structure spectroscopy has been applied to study atomic short-range order in Co 74Cr 28 magnetic thin films. The obtained results can only be understood in the frame of a suggested microphase segregation into regions with different stoichiometries. The disorder around Cr atoms increases with the substrate temperature of the deposition process, whereas the Co surroundings exhibit only minor differences. Despite this segregation, the h.c.p. structure type is maintained in the whole structure, and no similarity to, for example, the f.c.c. structure of pure Cr appears.
ISSN:0040-6090
1879-2731
DOI:10.1016/0040-6090(94)90053-1