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Energy dispersive X-ray spectroscopic analysis in a microscopic area of a grain in YBCO ceramic superconductor

EDX analysis is a relatively new method for determining the atomic percentage of a specimen. Within a microscopic region, about 10 x 10 micron in this experiment, measurements of the atomic percentages of different elements in different positions on a smooth and plane grain surface are accurate with...

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Bibliographic Details
Published in:Journal of materials science letters 1994-01, Vol.13 (8), p.586-588
Main Authors: CHOW, J. C. L, FUNG, P. C. W
Format: Article
Language:English
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Summary:EDX analysis is a relatively new method for determining the atomic percentage of a specimen. Within a microscopic region, about 10 x 10 micron in this experiment, measurements of the atomic percentages of different elements in different positions on a smooth and plane grain surface are accurate within about 8% using EDX analysis. 8 refs.
ISSN:0261-8028
1573-4811
DOI:10.1007/bf00592616