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Energy dispersive X-ray spectroscopic analysis in a microscopic area of a grain in YBCO ceramic superconductor
EDX analysis is a relatively new method for determining the atomic percentage of a specimen. Within a microscopic region, about 10 x 10 micron in this experiment, measurements of the atomic percentages of different elements in different positions on a smooth and plane grain surface are accurate with...
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Published in: | Journal of materials science letters 1994-01, Vol.13 (8), p.586-588 |
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Main Authors: | , |
Format: | Article |
Language: | English |
Subjects: | |
Citations: | Items that this one cites Items that cite this one |
Online Access: | Get full text |
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Summary: | EDX analysis is a relatively new method for determining the atomic percentage of a specimen. Within a microscopic region, about 10 x 10 micron in this experiment, measurements of the atomic percentages of different elements in different positions on a smooth and plane grain surface are accurate within about 8% using EDX analysis. 8 refs. |
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ISSN: | 0261-8028 1573-4811 |
DOI: | 10.1007/bf00592616 |