Loading…

Detection of Minor Crystalline Phases in Alumina Ceramics Using Synchrotron Radiation Diffraction

The use of synchrotron radiation diffraction (SRD) in con‐junction with conventional laboratory X‐ray diffraction (XRD) for analyzing the phase assemblage of selected alu‐mina‐based ceramics is described. This paper outlines the benefits of synchrotron powder diffraction in resolving mi‐norand impur...

Full description

Saved in:
Bibliographic Details
Published in:Journal of the American Ceramic Society 1997-11, Vol.80 (11), p.2941-2944
Main Authors: Latella, Bruno A., O'Connor, Brian H.
Format: Article
Language:English
Subjects:
Citations: Items that this one cites
Items that cite this one
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
cited_by cdi_FETCH-LOGICAL-c5001-8dba5303ce8859f404691634c2d9a24a0bbb3cb09aa05065a2634167f7f68c583
cites cdi_FETCH-LOGICAL-c5001-8dba5303ce8859f404691634c2d9a24a0bbb3cb09aa05065a2634167f7f68c583
container_end_page 2944
container_issue 11
container_start_page 2941
container_title Journal of the American Ceramic Society
container_volume 80
creator Latella, Bruno A.
O'Connor, Brian H.
description The use of synchrotron radiation diffraction (SRD) in con‐junction with conventional laboratory X‐ray diffraction (XRD) for analyzing the phase assemblage of selected alu‐mina‐based ceramics is described. This paper outlines the benefits of synchrotron powder diffraction in resolving mi‐norand impurity phases in various alumina ceramics. Laboratory XRD is shown to provide only cursory details of minor crystalline phases which are strikingly evident and clearly defined from application of SRD analysis. The po‐tential of SRD techniques to characterize low‐level crystal‐line phases and as a check for “phase purity” in ceramic systems is considered.
doi_str_mv 10.1111/j.1151-2916.1997.tb03216.x
format article
fullrecord <record><control><sourceid>proquest_cross</sourceid><recordid>TN_cdi_proquest_miscellaneous_26524381</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>26524381</sourcerecordid><originalsourceid>FETCH-LOGICAL-c5001-8dba5303ce8859f404691634c2d9a24a0bbb3cb09aa05065a2634167f7f68c583</originalsourceid><addsrcrecordid>eNqVkU1vEzEQhi0EEqHwH6wKcdvgz7XNiWhb2qJSoFBxtGYdL3XYeIu9Ecm_r7eJeuAEvoxG8_qZjxehY0rmtLy3qxIkrZih9Zwao-ZjSzgryfYJmlF5KD1FM0IIq5Rm5Dl6kfOqpNRoMUNw4kfvxjBEPHT4U4hDwk3a5RH6PkSPv9xC9hmHiBf9Zh0i4MYnWAeX8U0O8Sf-tovuNg1jKoRrWAZ4YJ2ErkvwwH2JnnXQZ__qEI_QzYfT7815dfn57KJZXFZOlmEqvWxBcsKd11qaThBRl8m5cGxpgAkgbdty1xIDQCSpJbBSpLXqVFdrJzU_Qm_23Ls0_N74PNp1yM73PUQ_bLJltWSCa_ovQqok4UV4_JdwNWxSLEtYRpXWWplJ9G4vcmnIOfnO3qWwhrSzlNjJI7uyk0d2MsJOHtmDR3ZbPr8-dIDsoC8niy7kRwIjSkihiuz9XvYn9H73Hw3sx0VzyoyYlq72iJBHv31EQPpla8WVtD-uzmz9lfBzTa7sNb8HWdy0YQ</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>217888793</pqid></control><display><type>article</type><title>Detection of Minor Crystalline Phases in Alumina Ceramics Using Synchrotron Radiation Diffraction</title><source>Wiley-Blackwell Read &amp; Publish Collection</source><creator>Latella, Bruno A. ; O'Connor, Brian H.</creator><creatorcontrib>Latella, Bruno A. ; O'Connor, Brian H.</creatorcontrib><description>The use of synchrotron radiation diffraction (SRD) in con‐junction with conventional laboratory X‐ray diffraction (XRD) for analyzing the phase assemblage of selected alu‐mina‐based ceramics is described. This paper outlines the benefits of synchrotron powder diffraction in resolving mi‐norand impurity phases in various alumina ceramics. Laboratory XRD is shown to provide only cursory details of minor crystalline phases which are strikingly evident and clearly defined from application of SRD analysis. The po‐tential of SRD techniques to characterize low‐level crystal‐line phases and as a check for “phase purity” in ceramic systems is considered.</description><identifier>ISSN: 0002-7820</identifier><identifier>EISSN: 1551-2916</identifier><identifier>DOI: 10.1111/j.1151-2916.1997.tb03216.x</identifier><identifier>CODEN: JACTAW</identifier><language>eng</language><publisher>Westerville, Ohio: American Ceramics Society</publisher><subject>Applied sciences ; Building materials. Ceramics. Glasses ; Ceramic industries ; Chemical industry and chemicals ; Exact sciences and technology ; Miscellaneous ; Technical ceramics</subject><ispartof>Journal of the American Ceramic Society, 1997-11, Vol.80 (11), p.2941-2944</ispartof><rights>1998 INIST-CNRS</rights><rights>Copyright American Ceramic Society Nov 1997</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c5001-8dba5303ce8859f404691634c2d9a24a0bbb3cb09aa05065a2634167f7f68c583</citedby><cites>FETCH-LOGICAL-c5001-8dba5303ce8859f404691634c2d9a24a0bbb3cb09aa05065a2634167f7f68c583</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,776,780,27901,27902</link.rule.ids><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&amp;idt=2074547$$DView record in Pascal Francis$$Hfree_for_read</backlink></links><search><creatorcontrib>Latella, Bruno A.</creatorcontrib><creatorcontrib>O'Connor, Brian H.</creatorcontrib><title>Detection of Minor Crystalline Phases in Alumina Ceramics Using Synchrotron Radiation Diffraction</title><title>Journal of the American Ceramic Society</title><description>The use of synchrotron radiation diffraction (SRD) in con‐junction with conventional laboratory X‐ray diffraction (XRD) for analyzing the phase assemblage of selected alu‐mina‐based ceramics is described. This paper outlines the benefits of synchrotron powder diffraction in resolving mi‐norand impurity phases in various alumina ceramics. Laboratory XRD is shown to provide only cursory details of minor crystalline phases which are strikingly evident and clearly defined from application of SRD analysis. The po‐tential of SRD techniques to characterize low‐level crystal‐line phases and as a check for “phase purity” in ceramic systems is considered.</description><subject>Applied sciences</subject><subject>Building materials. Ceramics. Glasses</subject><subject>Ceramic industries</subject><subject>Chemical industry and chemicals</subject><subject>Exact sciences and technology</subject><subject>Miscellaneous</subject><subject>Technical ceramics</subject><issn>0002-7820</issn><issn>1551-2916</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>1997</creationdate><recordtype>article</recordtype><recordid>eNqVkU1vEzEQhi0EEqHwH6wKcdvgz7XNiWhb2qJSoFBxtGYdL3XYeIu9Ecm_r7eJeuAEvoxG8_qZjxehY0rmtLy3qxIkrZih9Zwao-ZjSzgryfYJmlF5KD1FM0IIq5Rm5Dl6kfOqpNRoMUNw4kfvxjBEPHT4U4hDwk3a5RH6PkSPv9xC9hmHiBf9Zh0i4MYnWAeX8U0O8Sf-tovuNg1jKoRrWAZ4YJ2ErkvwwH2JnnXQZ__qEI_QzYfT7815dfn57KJZXFZOlmEqvWxBcsKd11qaThBRl8m5cGxpgAkgbdty1xIDQCSpJbBSpLXqVFdrJzU_Qm_23Ls0_N74PNp1yM73PUQ_bLJltWSCa_ovQqok4UV4_JdwNWxSLEtYRpXWWplJ9G4vcmnIOfnO3qWwhrSzlNjJI7uyk0d2MsJOHtmDR3ZbPr8-dIDsoC8niy7kRwIjSkihiuz9XvYn9H73Hw3sx0VzyoyYlq72iJBHv31EQPpla8WVtD-uzmz9lfBzTa7sNb8HWdy0YQ</recordid><startdate>199711</startdate><enddate>199711</enddate><creator>Latella, Bruno A.</creator><creator>O'Connor, Brian H.</creator><general>American Ceramics Society</general><general>Blackwell</general><general>Wiley Subscription Services, Inc</general><scope>BSCLL</scope><scope>IQODW</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7QQ</scope><scope>7SR</scope><scope>8FD</scope><scope>JG9</scope><scope>H8D</scope><scope>L7M</scope></search><sort><creationdate>199711</creationdate><title>Detection of Minor Crystalline Phases in Alumina Ceramics Using Synchrotron Radiation Diffraction</title><author>Latella, Bruno A. ; O'Connor, Brian H.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c5001-8dba5303ce8859f404691634c2d9a24a0bbb3cb09aa05065a2634167f7f68c583</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>1997</creationdate><topic>Applied sciences</topic><topic>Building materials. Ceramics. Glasses</topic><topic>Ceramic industries</topic><topic>Chemical industry and chemicals</topic><topic>Exact sciences and technology</topic><topic>Miscellaneous</topic><topic>Technical ceramics</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Latella, Bruno A.</creatorcontrib><creatorcontrib>O'Connor, Brian H.</creatorcontrib><collection>Istex</collection><collection>Pascal-Francis</collection><collection>CrossRef</collection><collection>Ceramic Abstracts</collection><collection>Engineered Materials Abstracts</collection><collection>Technology Research Database</collection><collection>Materials Research Database</collection><collection>Aerospace Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>Journal of the American Ceramic Society</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Latella, Bruno A.</au><au>O'Connor, Brian H.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Detection of Minor Crystalline Phases in Alumina Ceramics Using Synchrotron Radiation Diffraction</atitle><jtitle>Journal of the American Ceramic Society</jtitle><date>1997-11</date><risdate>1997</risdate><volume>80</volume><issue>11</issue><spage>2941</spage><epage>2944</epage><pages>2941-2944</pages><issn>0002-7820</issn><eissn>1551-2916</eissn><coden>JACTAW</coden><abstract>The use of synchrotron radiation diffraction (SRD) in con‐junction with conventional laboratory X‐ray diffraction (XRD) for analyzing the phase assemblage of selected alu‐mina‐based ceramics is described. This paper outlines the benefits of synchrotron powder diffraction in resolving mi‐norand impurity phases in various alumina ceramics. Laboratory XRD is shown to provide only cursory details of minor crystalline phases which are strikingly evident and clearly defined from application of SRD analysis. The po‐tential of SRD techniques to characterize low‐level crystal‐line phases and as a check for “phase purity” in ceramic systems is considered.</abstract><cop>Westerville, Ohio</cop><pub>American Ceramics Society</pub><doi>10.1111/j.1151-2916.1997.tb03216.x</doi><tpages>4</tpages></addata></record>
fulltext fulltext
identifier ISSN: 0002-7820
ispartof Journal of the American Ceramic Society, 1997-11, Vol.80 (11), p.2941-2944
issn 0002-7820
1551-2916
language eng
recordid cdi_proquest_miscellaneous_26524381
source Wiley-Blackwell Read & Publish Collection
subjects Applied sciences
Building materials. Ceramics. Glasses
Ceramic industries
Chemical industry and chemicals
Exact sciences and technology
Miscellaneous
Technical ceramics
title Detection of Minor Crystalline Phases in Alumina Ceramics Using Synchrotron Radiation Diffraction
url http://sfxeu10.hosted.exlibrisgroup.com/loughborough?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-21T18%3A51%3A04IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Detection%20of%20Minor%20Crystalline%20Phases%20in%20Alumina%20Ceramics%20Using%20Synchrotron%20Radiation%20Diffraction&rft.jtitle=Journal%20of%20the%20American%20Ceramic%20Society&rft.au=Latella,%20Bruno%20A.&rft.date=1997-11&rft.volume=80&rft.issue=11&rft.spage=2941&rft.epage=2944&rft.pages=2941-2944&rft.issn=0002-7820&rft.eissn=1551-2916&rft.coden=JACTAW&rft_id=info:doi/10.1111/j.1151-2916.1997.tb03216.x&rft_dat=%3Cproquest_cross%3E26524381%3C/proquest_cross%3E%3Cgrp_id%3Ecdi_FETCH-LOGICAL-c5001-8dba5303ce8859f404691634c2d9a24a0bbb3cb09aa05065a2634167f7f68c583%3C/grp_id%3E%3Coa%3E%3C/oa%3E%3Curl%3E%3C/url%3E&rft_id=info:oai/&rft_pqid=217888793&rft_id=info:pmid/&rfr_iscdi=true