Demonstration of the g.b x u = 0 edge dislocation invisibility criterion for electron channelling contrast imaging

Dislocations with a large edge component do not exhibit a full loss of diffraction contrast in the transmission electron microscope unless the conditions gb = 0 and gb x u = 0 are simultaneously met. Because of a similarity between transmission electron microscopy (TEM) diffraction contrast and elec...

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Bibliographic Details
Published in:Philosophical magazine letters 2001-12, Vol.81 (12), p.833-837
Main Authors: CRIMP, M. A, SIMKIN, B. A, NG, B. C
Format: Article
Language:English
Subjects:
Condensed matter: structure, mechanical and thermal properties
Defects and impurities in crystals
microstructure
Exact sciences and technology
Indirect evidence of dislocations and other defects (resistivity, slip, creep, strains, internal friction, epr, nmr, etc.)
Physics
Structure of solids and liquids
crystallography
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Summary:Dislocations with a large edge component do not exhibit a full loss of diffraction contrast in the transmission electron microscope unless the conditions gb = 0 and gb x u = 0 are simultaneously met. Because of a similarity between transmission electron microscopy (TEM) diffraction contrast and electron channelling contrast in the scanning electron microscope, the same contrast rules would be expected to apply for electron channelling contrast imaging (ECCI). Using the characteristic edge dislocations formed in annealed FeAl, it is demonstrated that the same extinction conditions apply for TEM diffraction contrast and ECCI.
ISSN:0950-0839
1362-3036