FTIR Ellipsometry as a Tool for Studying Organic Layers: From Langmuir-Blodgett Films to Can Coatings

The capabilities of infrared ellipsometry to examine structurally various thin organic layers deposited on different substrates are demonstrated in this contribution. The presented examples involve: Langmuir‐Blodgett film on gold substrate, anisotropic film of polystyrene on a silicon wafer, implant...

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Bibliographic Details
Published in:Physica status solidi. A, Applied research Applied research, 2001-12, Vol.188 (4), p.1319-1329
Main Authors: Tsankov, D., Hinrichs, K., Röseler, A., Korte, E.H.
Format: Article
Language:English
Subjects:
68.47.Pe
78.30.Jw
78.66.Qn
S12
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Summary:The capabilities of infrared ellipsometry to examine structurally various thin organic layers deposited on different substrates are demonstrated in this contribution. The presented examples involve: Langmuir‐Blodgett film on gold substrate, anisotropic film of polystyrene on a silicon wafer, implanted fluorinated surface layer into a bulk polyethylene fuel tank and can coating deposited on electrolytically‐plated steel (tinplate). Different calculational procedures were used to determine the film optical constants and thickness.
ISSN:0031-8965
1521-396X
DOI:10.1002/1521-396X(200112)188:4<1319::AID-PSSA1319>3.0.CO;2-V