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Magnon excitation of CoFe/Al-oxide/CoFe ferromagnetic tunnel junctions
Inelastic-electron-tunneling (IET) spectroscopy has been applied to investigate the magnon-induced inelastic tunneling process for Ta/Ni 80Fe 20/Cu/Ni 80Fe 20/IrMn/Co 75Fe 25/Al-oxide/Co 75Fe 25/Ni 80Fe 20/Ta ferromagnetic tunnel junctions. For the junction with the oxidation time, t ox =40 s , whic...
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Published in: | Journal of magnetism and magnetic materials 2001-05, Vol.226, p.922-923 |
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creator | Murai, J Ando, Y Daibou, T Yaoita, K Han, H.F Miyazaki, T |
description | Inelastic-electron-tunneling (IET) spectroscopy has been applied to investigate the magnon-induced inelastic tunneling process for Ta/Ni
80Fe
20/Cu/Ni
80Fe
20/IrMn/Co
75Fe
25/Al-oxide/Co
75Fe
25/Ni
80Fe
20/Ta ferromagnetic tunnel junctions. For the junction with the oxidation time,
t
ox
=40
s
, which is the exact time to oxidize the 8
Å Al, the subtraction spectrum of the IET spectra between the parallel and anti-parallel magnetization configurations clearly showed two peaks at ±3
and ±16
mV showed. On the other hand, the spectrum for the junction with
t
ox
=120
s
showed a broad peak at around 18
mV and a plateau at zero-bias. This was caused by the change of the correlation length of magnon inelastic excitation due to the over oxidation of the bottom electrode. |
doi_str_mv | 10.1016/S0304-8853(00)01105-7 |
format | article |
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80Fe
20/Cu/Ni
80Fe
20/IrMn/Co
75Fe
25/Al-oxide/Co
75Fe
25/Ni
80Fe
20/Ta ferromagnetic tunnel junctions. For the junction with the oxidation time,
t
ox
=40
s
, which is the exact time to oxidize the 8
Å Al, the subtraction spectrum of the IET spectra between the parallel and anti-parallel magnetization configurations clearly showed two peaks at ±3
and ±16
mV showed. On the other hand, the spectrum for the junction with
t
ox
=120
s
showed a broad peak at around 18
mV and a plateau at zero-bias. This was caused by the change of the correlation length of magnon inelastic excitation due to the over oxidation of the bottom electrode.</description><identifier>ISSN: 0304-8853</identifier><identifier>DOI: 10.1016/S0304-8853(00)01105-7</identifier><language>eng</language><publisher>Elsevier B.V</publisher><subject>Interface structure ; Magnons ; Transport properties ; Tunneling</subject><ispartof>Journal of magnetism and magnetic materials, 2001-05, Vol.226, p.922-923</ispartof><rights>2001 Elsevier Science B.V.</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><cites>FETCH-LOGICAL-c288t-574519a3e1730d7e5b1bd5fbe6516cf4154ed93e29f2f234169432b2cfde86753</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,780,784,27924,27925</link.rule.ids></links><search><creatorcontrib>Murai, J</creatorcontrib><creatorcontrib>Ando, Y</creatorcontrib><creatorcontrib>Daibou, T</creatorcontrib><creatorcontrib>Yaoita, K</creatorcontrib><creatorcontrib>Han, H.F</creatorcontrib><creatorcontrib>Miyazaki, T</creatorcontrib><title>Magnon excitation of CoFe/Al-oxide/CoFe ferromagnetic tunnel junctions</title><title>Journal of magnetism and magnetic materials</title><description>Inelastic-electron-tunneling (IET) spectroscopy has been applied to investigate the magnon-induced inelastic tunneling process for Ta/Ni
80Fe
20/Cu/Ni
80Fe
20/IrMn/Co
75Fe
25/Al-oxide/Co
75Fe
25/Ni
80Fe
20/Ta ferromagnetic tunnel junctions. For the junction with the oxidation time,
t
ox
=40
s
, which is the exact time to oxidize the 8
Å Al, the subtraction spectrum of the IET spectra between the parallel and anti-parallel magnetization configurations clearly showed two peaks at ±3
and ±16
mV showed. On the other hand, the spectrum for the junction with
t
ox
=120
s
showed a broad peak at around 18
mV and a plateau at zero-bias. This was caused by the change of the correlation length of magnon inelastic excitation due to the over oxidation of the bottom electrode.</description><subject>Interface structure</subject><subject>Magnons</subject><subject>Transport properties</subject><subject>Tunneling</subject><issn>0304-8853</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2001</creationdate><recordtype>article</recordtype><recordid>eNqFkL1OwzAUhT2ARCk8AlImBEPodWzHyYSqigJSEQMwW4lzjVylcbEdVN6-SYtYme6PzjnS-Qi5onBHgeazN2DA06IQ7AbgFigFkcoTMvl7n5HzENYAQHmRT8jypfrsXJfgTttYRTusziQLt8TZvE3dzjY4G6_EoPduM4gxWp3EvuuwTdZ9p0dPuCCnpmoDXv7OKflYPrwvntLV6-PzYr5KdVYUMRWSC1pWDKlk0EgUNa0bYWrMBc214VRwbEqGWWkykzFO85KzrM60abDIpWBTcn3M3Xr31WOIamODxratOnR9UFkuCy5lOQjFUai9C8GjUVtvN5X_URTUSEodSKkRiQJQB1JKDr77ow-HFt8WvQraYqexsR51VI2z_yTsAVyscas</recordid><startdate>20010501</startdate><enddate>20010501</enddate><creator>Murai, J</creator><creator>Ando, Y</creator><creator>Daibou, T</creator><creator>Yaoita, K</creator><creator>Han, H.F</creator><creator>Miyazaki, T</creator><general>Elsevier B.V</general><scope>AAYXX</scope><scope>CITATION</scope><scope>7SP</scope><scope>8FD</scope><scope>L7M</scope></search><sort><creationdate>20010501</creationdate><title>Magnon excitation of CoFe/Al-oxide/CoFe ferromagnetic tunnel junctions</title><author>Murai, J ; Ando, Y ; Daibou, T ; Yaoita, K ; Han, H.F ; Miyazaki, T</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c288t-574519a3e1730d7e5b1bd5fbe6516cf4154ed93e29f2f234169432b2cfde86753</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2001</creationdate><topic>Interface structure</topic><topic>Magnons</topic><topic>Transport properties</topic><topic>Tunneling</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Murai, J</creatorcontrib><creatorcontrib>Ando, Y</creatorcontrib><creatorcontrib>Daibou, T</creatorcontrib><creatorcontrib>Yaoita, K</creatorcontrib><creatorcontrib>Han, H.F</creatorcontrib><creatorcontrib>Miyazaki, T</creatorcontrib><collection>CrossRef</collection><collection>Electronics & Communications Abstracts</collection><collection>Technology Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>Journal of magnetism and magnetic materials</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Murai, J</au><au>Ando, Y</au><au>Daibou, T</au><au>Yaoita, K</au><au>Han, H.F</au><au>Miyazaki, T</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Magnon excitation of CoFe/Al-oxide/CoFe ferromagnetic tunnel junctions</atitle><jtitle>Journal of magnetism and magnetic materials</jtitle><date>2001-05-01</date><risdate>2001</risdate><volume>226</volume><spage>922</spage><epage>923</epage><pages>922-923</pages><issn>0304-8853</issn><abstract>Inelastic-electron-tunneling (IET) spectroscopy has been applied to investigate the magnon-induced inelastic tunneling process for Ta/Ni
80Fe
20/Cu/Ni
80Fe
20/IrMn/Co
75Fe
25/Al-oxide/Co
75Fe
25/Ni
80Fe
20/Ta ferromagnetic tunnel junctions. For the junction with the oxidation time,
t
ox
=40
s
, which is the exact time to oxidize the 8
Å Al, the subtraction spectrum of the IET spectra between the parallel and anti-parallel magnetization configurations clearly showed two peaks at ±3
and ±16
mV showed. On the other hand, the spectrum for the junction with
t
ox
=120
s
showed a broad peak at around 18
mV and a plateau at zero-bias. This was caused by the change of the correlation length of magnon inelastic excitation due to the over oxidation of the bottom electrode.</abstract><pub>Elsevier B.V</pub><doi>10.1016/S0304-8853(00)01105-7</doi><tpages>2</tpages></addata></record> |
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identifier | ISSN: 0304-8853 |
ispartof | Journal of magnetism and magnetic materials, 2001-05, Vol.226, p.922-923 |
issn | 0304-8853 |
language | eng |
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source | ScienceDirect Freedom Collection |
subjects | Interface structure Magnons Transport properties Tunneling |
title | Magnon excitation of CoFe/Al-oxide/CoFe ferromagnetic tunnel junctions |
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