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A study of the behaviour of subinterface cracks in bimaterial plates
In this paper, finite element analysis of a subinterface crack in a bimaterial plate is presented with a view to quantify the definitive trends as the subinterface crack approaches the interface. The material properties of the bimaterial plate were chosen such that the crack-tip contact zones are la...
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Published in: | Engineering fracture mechanics 1998, Vol.59 (2), p.241-252 |
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Main Authors: | , , |
Format: | Article |
Language: | English |
Subjects: | |
Citations: | Items that this one cites Items that cite this one |
Online Access: | Get full text |
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Summary: | In this paper, finite element analysis of a subinterface crack in a bimaterial plate is presented with a view to quantify the definitive trends as the subinterface crack approaches the interface. The material properties of the bimaterial plate were chosen such that the crack-tip contact zones are large for the corresponding case of a bare interface crack problem. Both mode I and mode II loadings were studied separately and strain energy release rate (SERR) components were calculated when the subinterface crack lies parallel and at a distance “
s
” from the interface for various virtual crack extension (Δ
a) values. The SERR components at the subinterface crack tip were evaluated using a special generalized modified crack closure integral (GMCCI) algorithm, developed in an earlier paper by the present authors. The SERR components were evaluated for several
s values and the study has clearly brought out the behaviour of SERR components as the distance of the subinterface crack
s decreases to zero from a value of the order of the crack length. By carrying out a systematic finite element study of the variation of SERR components with Δ
a/
a for various
s values, the bare interface crack behaviour with stress-free crack faces reported in the literature was reproduced as
s→0 in the present problem. Numerical results are presented for a specially designed problem with large crack-tip contact zones. |
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ISSN: | 0013-7944 1873-7315 |
DOI: | 10.1016/S0013-7944(97)00129-X |