Waveguide attenuation characterisation by the mirage effect

We demonstrate a new destruction-free method for the investigation of waveguide losses. Typically the intensity profile is measured directly or the scattered light is imaged. Here we contactless measure the photothermal response due to intrinsic absorption of the waveguide material in front of the p...

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Bibliographic Details
Published in:Optics communications 1998-08, Vol.153 (4), p.202-206
Main Authors: Kreiter, Maximilian J.S, Krämer, Stephan, Mittler-Neher, Silvia
Format: Article
Language:English
Subjects:
Applied sciences
Circuit properties
Electric, optical and optoelectronic circuits
Electronics
Exact sciences and technology
Fundamental areas of phenomenology (including applications)
Integrated optics. Optical fibers and wave guides
Optical and optoelectronic circuits
Optics
Photothermal beam deflection
Physics
Wave optics
Wave propagation, transmission and absorption
Waveguide losses
Waveguides, couplers, and arrays
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Description
Summary:We demonstrate a new destruction-free method for the investigation of waveguide losses. Typically the intensity profile is measured directly or the scattered light is imaged. Here we contactless measure the photothermal response due to intrinsic absorption of the waveguide material in front of the propagating mode. The experimental setup and measurements, including an estimation of the expected resolution, are given.
ISSN:0030-4018
1873-0310
DOI:10.1016/S0030-4018(98)00265-X