Z-scan with arbitrary aperture transmittance: the strongly nonlinear regime

We consider theoretical models of nonlinear optical propagation suitable for describing optical Z-scan measurements within the strongly nonlinear regime. In particular, we demonstrate the equivalence of two alternative descriptions of beam propagation from a thin nonlinear refractor, in which the tr...

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Published in:Optics communications 1998-09, Vol.154 (4), p.225-233
Main Authors: Hermann, J.A., McKay, T.J., McDuff, R.G.
Format: Article
Language:English
Subjects:
Exact sciences and technology
Fundamental areas of phenomenology (including applications)
Nonlinear optics
Optics
Physics
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description We consider theoretical models of nonlinear optical propagation suitable for describing optical Z-scan measurements within the strongly nonlinear regime. In particular, we demonstrate the equivalence of two alternative descriptions of beam propagation from a thin nonlinear refractor, in which the transmission measurements are modelled using a receiving aperture of arbitrary size. If nonlinear absorption is the dominant process, then we predict that a localized peak within the normalized transmittance will appear at the waist position and should be observable if the nonlinear interaction is sufficiently strong.
doi_str_mv 10.1016/S0030-4018(98)00287-9
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subjects Exact sciences and technology
Fundamental areas of phenomenology (including applications)
Nonlinear optics
Optics
Physics
title Z-scan with arbitrary aperture transmittance: the strongly nonlinear regime
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