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Preparation and electromechanical properties of PZT/PGO thick films on alumina substrate
PZT thick films with lead germanate as low temperature sintering aid were prepared on alumina substrates. The thickness of films after sintering procedures reached 50 μm. Chemical compatibility and microstructure of layers was studied by EDS/SEM analysis. A fit between theoretical and experimental e...
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| Published in: | Journal of the European Ceramic Society 2001, Vol.21 (10), p.1445-1449 |
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| Main Authors: | , , , , , |
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| Language: | English |
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| cited_by | cdi_FETCH-LOGICAL-c433t-fe2af65303b9ac5872a383e5f86c273bdbc7feb711a05fdac29b32b6b307c5b73 |
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| cites | cdi_FETCH-LOGICAL-c433t-fe2af65303b9ac5872a383e5f86c273bdbc7feb711a05fdac29b32b6b307c5b73 |
| container_end_page | 1449 |
| container_issue | 10 |
| container_start_page | 1445 |
| container_title | Journal of the European Ceramic Society |
| container_volume | 21 |
| creator | Tran-Huu-Hue, Pascal Levassort, Franck Vander Meulen, François Holc, Janez Kosec, Marija Lethiecq, Marc |
| description | PZT thick films with lead germanate as low temperature sintering aid were prepared on alumina substrates. The thickness of films after sintering procedures reached 50 μm. Chemical compatibility and microstructure of layers was studied by EDS/SEM analysis. A fit between theoretical and experimental electrical impedance of several samples as a function of frequency is used to determine the elastic, dielectric and piezoelectric properties in thickness mode of the ceramic layers. Results for different poling fields (3 and 12 kV/mm) and sintering temperatures are obtained. Finally, the KLM equivalent circuit is used to obtain simulations of transducers integrating these thick films and their performance for medical imaging applications is evaluated. |
| doi_str_mv | 10.1016/S0955-2219(01)00038-3 |
| format | article |
| fullrecord | <record><control><sourceid>proquest_cross</sourceid><recordid>TN_cdi_proquest_miscellaneous_26900377</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><els_id>S0955221901000383</els_id><sourcerecordid>26900377</sourcerecordid><originalsourceid>FETCH-LOGICAL-c433t-fe2af65303b9ac5872a383e5f86c273bdbc7feb711a05fdac29b32b6b307c5b73</originalsourceid><addsrcrecordid>eNqFkF1LwzAUhoMoOKc_QeiFiF7UJY1tmiuRoVMYbOCE4U1I0hMW7ZdJK_jvTbch3nl14PC85-NB6JzgG4JJNnnBPE3jJCH8CpNrjDHNY3qARiRnNM4IXx-i0S9yjE68f8eYMMz5CK2XDlrpZGebOpJ1EUEJunNNBXoja6tlGbWuacF1FnzUmGj5tposZ4uo21j9ERlbVqEdomVf2VpGvle-C-PgFB0ZWXo429cxen18WE2f4vli9jy9n8f6ltIuNpBIk6UUU8WlTnOWSJpTSE2e6YRRVSjNDChGiMSpKaROuKKJyhTFTKeK0TG63M0NZ3724DtRWa-hLGUNTe9FkvEghA1gugO1a7x3YETrbCXdtyBYDB7F1qMYJAlMxNajoCF3sV8gfdBhnKy19X_Cec7wgN3tMAjPfllwwmsLtYbCumBUFI39Z9EPtnWIIA</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>26900377</pqid></control><display><type>article</type><title>Preparation and electromechanical properties of PZT/PGO thick films on alumina substrate</title><source>ScienceDirect Journals</source><creator>Tran-Huu-Hue, Pascal ; Levassort, Franck ; Vander Meulen, François ; Holc, Janez ; Kosec, Marija ; Lethiecq, Marc</creator><contributor>WCA</contributor><creatorcontrib>Tran-Huu-Hue, Pascal ; Levassort, Franck ; Vander Meulen, François ; Holc, Janez ; Kosec, Marija ; Lethiecq, Marc ; WCA</creatorcontrib><description>PZT thick films with lead germanate as low temperature sintering aid were prepared on alumina substrates. The thickness of films after sintering procedures reached 50 μm. Chemical compatibility and microstructure of layers was studied by EDS/SEM analysis. A fit between theoretical and experimental electrical impedance of several samples as a function of frequency is used to determine the elastic, dielectric and piezoelectric properties in thickness mode of the ceramic layers. Results for different poling fields (3 and 12 kV/mm) and sintering temperatures are obtained. Finally, the KLM equivalent circuit is used to obtain simulations of transducers integrating these thick films and their performance for medical imaging applications is evaluated.</description><identifier>ISSN: 0955-2219</identifier><identifier>EISSN: 1873-619X</identifier><identifier>DOI: 10.1016/S0955-2219(01)00038-3</identifier><language>eng</language><publisher>Oxford: Elsevier Ltd</publisher><subject>Applied sciences ; Building materials. Ceramics. Glasses ; Ceramic industries ; Chemical industry and chemicals ; Condensed matter: electronic structure, electrical, magnetic, and optical properties ; Cross-disciplinary physics: materials science; rheology ; Dielectric, piezoelectric, ferroelectric and antiferroelectric materials ; Dielectrics, piezoelectrics, and ferroelectrics and their properties ; Electrotechnical and electronic ceramics ; Exact sciences and technology ; Impedance ; Materials science ; Materials synthesis; materials processing ; Methods of materials synthesis and materials processing ; Niobates, titanates, tantalates, pzt ceramics, etc ; Physics ; Piezoelectric properties ; PZT ; Technical ceramics ; Tranducers</subject><ispartof>Journal of the European Ceramic Society, 2001, Vol.21 (10), p.1445-1449</ispartof><rights>2001 Elsevier Science Ltd</rights><rights>2001 INIST-CNRS</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c433t-fe2af65303b9ac5872a383e5f86c273bdbc7feb711a05fdac29b32b6b307c5b73</citedby><cites>FETCH-LOGICAL-c433t-fe2af65303b9ac5872a383e5f86c273bdbc7feb711a05fdac29b32b6b307c5b73</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>309,310,314,780,784,789,790,4024,4050,4051,23930,23931,25140,27923,27924,27925</link.rule.ids><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=1088703$$DView record in Pascal Francis$$Hfree_for_read</backlink></links><search><contributor>WCA</contributor><creatorcontrib>Tran-Huu-Hue, Pascal</creatorcontrib><creatorcontrib>Levassort, Franck</creatorcontrib><creatorcontrib>Vander Meulen, François</creatorcontrib><creatorcontrib>Holc, Janez</creatorcontrib><creatorcontrib>Kosec, Marija</creatorcontrib><creatorcontrib>Lethiecq, Marc</creatorcontrib><title>Preparation and electromechanical properties of PZT/PGO thick films on alumina substrate</title><title>Journal of the European Ceramic Society</title><description>PZT thick films with lead germanate as low temperature sintering aid were prepared on alumina substrates. The thickness of films after sintering procedures reached 50 μm. Chemical compatibility and microstructure of layers was studied by EDS/SEM analysis. A fit between theoretical and experimental electrical impedance of several samples as a function of frequency is used to determine the elastic, dielectric and piezoelectric properties in thickness mode of the ceramic layers. Results for different poling fields (3 and 12 kV/mm) and sintering temperatures are obtained. Finally, the KLM equivalent circuit is used to obtain simulations of transducers integrating these thick films and their performance for medical imaging applications is evaluated.</description><subject>Applied sciences</subject><subject>Building materials. Ceramics. Glasses</subject><subject>Ceramic industries</subject><subject>Chemical industry and chemicals</subject><subject>Condensed matter: electronic structure, electrical, magnetic, and optical properties</subject><subject>Cross-disciplinary physics: materials science; rheology</subject><subject>Dielectric, piezoelectric, ferroelectric and antiferroelectric materials</subject><subject>Dielectrics, piezoelectrics, and ferroelectrics and their properties</subject><subject>Electrotechnical and electronic ceramics</subject><subject>Exact sciences and technology</subject><subject>Impedance</subject><subject>Materials science</subject><subject>Materials synthesis; materials processing</subject><subject>Methods of materials synthesis and materials processing</subject><subject>Niobates, titanates, tantalates, pzt ceramics, etc</subject><subject>Physics</subject><subject>Piezoelectric properties</subject><subject>PZT</subject><subject>Technical ceramics</subject><subject>Tranducers</subject><issn>0955-2219</issn><issn>1873-619X</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2001</creationdate><recordtype>article</recordtype><recordid>eNqFkF1LwzAUhoMoOKc_QeiFiF7UJY1tmiuRoVMYbOCE4U1I0hMW7ZdJK_jvTbch3nl14PC85-NB6JzgG4JJNnnBPE3jJCH8CpNrjDHNY3qARiRnNM4IXx-i0S9yjE68f8eYMMz5CK2XDlrpZGebOpJ1EUEJunNNBXoja6tlGbWuacF1FnzUmGj5tposZ4uo21j9ERlbVqEdomVf2VpGvle-C-PgFB0ZWXo429cxen18WE2f4vli9jy9n8f6ltIuNpBIk6UUU8WlTnOWSJpTSE2e6YRRVSjNDChGiMSpKaROuKKJyhTFTKeK0TG63M0NZ3724DtRWa-hLGUNTe9FkvEghA1gugO1a7x3YETrbCXdtyBYDB7F1qMYJAlMxNajoCF3sV8gfdBhnKy19X_Cec7wgN3tMAjPfllwwmsLtYbCumBUFI39Z9EPtnWIIA</recordid><startdate>2001</startdate><enddate>2001</enddate><creator>Tran-Huu-Hue, Pascal</creator><creator>Levassort, Franck</creator><creator>Vander Meulen, François</creator><creator>Holc, Janez</creator><creator>Kosec, Marija</creator><creator>Lethiecq, Marc</creator><general>Elsevier Ltd</general><general>Elsevier</general><scope>IQODW</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7QQ</scope><scope>8FD</scope><scope>JG9</scope></search><sort><creationdate>2001</creationdate><title>Preparation and electromechanical properties of PZT/PGO thick films on alumina substrate</title><author>Tran-Huu-Hue, Pascal ; Levassort, Franck ; Vander Meulen, François ; Holc, Janez ; Kosec, Marija ; Lethiecq, Marc</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c433t-fe2af65303b9ac5872a383e5f86c273bdbc7feb711a05fdac29b32b6b307c5b73</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2001</creationdate><topic>Applied sciences</topic><topic>Building materials. Ceramics. Glasses</topic><topic>Ceramic industries</topic><topic>Chemical industry and chemicals</topic><topic>Condensed matter: electronic structure, electrical, magnetic, and optical properties</topic><topic>Cross-disciplinary physics: materials science; rheology</topic><topic>Dielectric, piezoelectric, ferroelectric and antiferroelectric materials</topic><topic>Dielectrics, piezoelectrics, and ferroelectrics and their properties</topic><topic>Electrotechnical and electronic ceramics</topic><topic>Exact sciences and technology</topic><topic>Impedance</topic><topic>Materials science</topic><topic>Materials synthesis; materials processing</topic><topic>Methods of materials synthesis and materials processing</topic><topic>Niobates, titanates, tantalates, pzt ceramics, etc</topic><topic>Physics</topic><topic>Piezoelectric properties</topic><topic>PZT</topic><topic>Technical ceramics</topic><topic>Tranducers</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Tran-Huu-Hue, Pascal</creatorcontrib><creatorcontrib>Levassort, Franck</creatorcontrib><creatorcontrib>Vander Meulen, François</creatorcontrib><creatorcontrib>Holc, Janez</creatorcontrib><creatorcontrib>Kosec, Marija</creatorcontrib><creatorcontrib>Lethiecq, Marc</creatorcontrib><collection>Pascal-Francis</collection><collection>CrossRef</collection><collection>Ceramic Abstracts</collection><collection>Technology Research Database</collection><collection>Materials Research Database</collection><jtitle>Journal of the European Ceramic Society</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Tran-Huu-Hue, Pascal</au><au>Levassort, Franck</au><au>Vander Meulen, François</au><au>Holc, Janez</au><au>Kosec, Marija</au><au>Lethiecq, Marc</au><au>WCA</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Preparation and electromechanical properties of PZT/PGO thick films on alumina substrate</atitle><jtitle>Journal of the European Ceramic Society</jtitle><date>2001</date><risdate>2001</risdate><volume>21</volume><issue>10</issue><spage>1445</spage><epage>1449</epage><pages>1445-1449</pages><issn>0955-2219</issn><eissn>1873-619X</eissn><abstract>PZT thick films with lead germanate as low temperature sintering aid were prepared on alumina substrates. The thickness of films after sintering procedures reached 50 μm. Chemical compatibility and microstructure of layers was studied by EDS/SEM analysis. A fit between theoretical and experimental electrical impedance of several samples as a function of frequency is used to determine the elastic, dielectric and piezoelectric properties in thickness mode of the ceramic layers. Results for different poling fields (3 and 12 kV/mm) and sintering temperatures are obtained. Finally, the KLM equivalent circuit is used to obtain simulations of transducers integrating these thick films and their performance for medical imaging applications is evaluated.</abstract><cop>Oxford</cop><pub>Elsevier Ltd</pub><doi>10.1016/S0955-2219(01)00038-3</doi><tpages>5</tpages></addata></record> |
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| ispartof | Journal of the European Ceramic Society, 2001, Vol.21 (10), p.1445-1449 |
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| source | ScienceDirect Journals |
| subjects | Applied sciences Building materials. Ceramics. Glasses Ceramic industries Chemical industry and chemicals Condensed matter: electronic structure, electrical, magnetic, and optical properties Cross-disciplinary physics: materials science rheology Dielectric, piezoelectric, ferroelectric and antiferroelectric materials Dielectrics, piezoelectrics, and ferroelectrics and their properties Electrotechnical and electronic ceramics Exact sciences and technology Impedance Materials science Materials synthesis materials processing Methods of materials synthesis and materials processing Niobates, titanates, tantalates, pzt ceramics, etc Physics Piezoelectric properties PZT Technical ceramics Tranducers |
| title | Preparation and electromechanical properties of PZT/PGO thick films on alumina substrate |
| url | http://sfxeu10.hosted.exlibrisgroup.com/loughborough?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-07T17%3A47%3A44IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Preparation%20and%20electromechanical%20properties%20of%20PZT/PGO%20thick%20films%20on%20alumina%20substrate&rft.jtitle=Journal%20of%20the%20European%20Ceramic%20Society&rft.au=Tran-Huu-Hue,%20Pascal&rft.date=2001&rft.volume=21&rft.issue=10&rft.spage=1445&rft.epage=1449&rft.pages=1445-1449&rft.issn=0955-2219&rft.eissn=1873-619X&rft_id=info:doi/10.1016/S0955-2219(01)00038-3&rft_dat=%3Cproquest_cross%3E26900377%3C/proquest_cross%3E%3Cgrp_id%3Ecdi_FETCH-LOGICAL-c433t-fe2af65303b9ac5872a383e5f86c273bdbc7feb711a05fdac29b32b6b307c5b73%3C/grp_id%3E%3Coa%3E%3C/oa%3E%3Curl%3E%3C/url%3E&rft_id=info:oai/&rft_pqid=26900377&rft_id=info:pmid/&rfr_iscdi=true |