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Roughness induced in plane uniaxial anisotropy in ultrathin Fe films

We have studied roughness induced in plane anisotropy, for ultrathin Fe films grown on MgO(1 0 0). When the films are grown, the deposition beam is directed toward the substrate at non-normal incidence, to produce a rough outer surface, with anisotropic roughness. We measure the roughness induced in...

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Bibliographic Details
Published in:Journal of magnetism and magnetic materials 2001, Vol.232 (1), p.36-45
Main Authors: Wolfe, J.H, Kawakami, R.K, Ling, W.L, Qiu, Z.Q, Arias, Rodrigo, Mills, D.L
Format: Article
Language:English
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Summary:We have studied roughness induced in plane anisotropy, for ultrathin Fe films grown on MgO(1 0 0). When the films are grown, the deposition beam is directed toward the substrate at non-normal incidence, to produce a rough outer surface, with anisotropic roughness. We measure the roughness induced in plane anisotropy fields for several samples with SMOKE, and we also perform STM measurements of the actual surface profile. This allows us to calculate the roughness induced in plane anisotropy produced by the dipolar mechanism, with no adjustable parameters, using the theory of Arias and Mills. Comparison between theory and experiment shows that anisotropy of dipolar origin is a major source of extrinsic in plane anisotropy.
ISSN:0304-8853
DOI:10.1016/S0304-8853(01)00016-6