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Roughness induced in plane uniaxial anisotropy in ultrathin Fe films
We have studied roughness induced in plane anisotropy, for ultrathin Fe films grown on MgO(1 0 0). When the films are grown, the deposition beam is directed toward the substrate at non-normal incidence, to produce a rough outer surface, with anisotropic roughness. We measure the roughness induced in...
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Published in: | Journal of magnetism and magnetic materials 2001, Vol.232 (1), p.36-45 |
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container_end_page | 45 |
container_issue | 1 |
container_start_page | 36 |
container_title | Journal of magnetism and magnetic materials |
container_volume | 232 |
creator | Wolfe, J.H Kawakami, R.K Ling, W.L Qiu, Z.Q Arias, Rodrigo Mills, D.L |
description | We have studied roughness induced in plane anisotropy, for ultrathin Fe films grown on MgO(1
0
0). When the films are grown, the deposition beam is directed toward the substrate at non-normal incidence, to produce a rough outer surface, with anisotropic roughness. We measure the roughness induced in plane anisotropy fields for several samples with SMOKE, and we also perform STM measurements of the actual surface profile. This allows us to calculate the roughness induced in plane anisotropy produced by the dipolar mechanism, with no adjustable parameters, using the theory of Arias and Mills. Comparison between theory and experiment shows that anisotropy of dipolar origin is a major source of extrinsic in plane anisotropy. |
doi_str_mv | 10.1016/S0304-8853(01)00016-6 |
format | article |
fullrecord | <record><control><sourceid>proquest_cross</sourceid><recordid>TN_cdi_proquest_miscellaneous_26924799</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><els_id>S0304885301000166</els_id><sourcerecordid>26924799</sourcerecordid><originalsourceid>FETCH-LOGICAL-c367t-c536eae4b10c7ebe9420ca621be93010e1dd02902f6a33e3fbd0dde5f843bd983</originalsourceid><addsrcrecordid>eNqFkE1PwzAMhnMAiTH4CUg9IASHgtO0WXtCaDBAmoTExzlKE5cFde2IW8T-Pek2IW6cbNmv_doPYyccLjlwefUCAtI4zzNxDvwCINRiucdGv-UDdkj0MTTSXI7Y7XPbvy8aJIpcY3uDNsRoVesGo75x-tvpOtKNo7bz7Wo9NPu687pbhGyGUeXqJR2x_UrXhMe7OGZvs7vX6UM8f7p_nN7MYyPkpItNJiRqTEsOZoIlFmkCRsuEh1QAB-TWQlJAUkktBIqqtGAtZlWeitIWuRizs-3elW8_e6ROLR0ZrIdr255UIosknRRFEGZbofEtkcdKrbxbar9WHNTASW04qQGIAq42nJQMc6c7A01G15XXjXH0Z1hAniZBdr2VYXj2y6FXZBw2AZ7zaDplW_eP0Q86O37P</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>26924799</pqid></control><display><type>article</type><title>Roughness induced in plane uniaxial anisotropy in ultrathin Fe films</title><source>Elsevier:Jisc Collections:Elsevier Read and Publish Agreement 2022-2024:Freedom Collection (Reading list)</source><creator>Wolfe, J.H ; Kawakami, R.K ; Ling, W.L ; Qiu, Z.Q ; Arias, Rodrigo ; Mills, D.L</creator><creatorcontrib>Wolfe, J.H ; Kawakami, R.K ; Ling, W.L ; Qiu, Z.Q ; Arias, Rodrigo ; Mills, D.L</creatorcontrib><description>We have studied roughness induced in plane anisotropy, for ultrathin Fe films grown on MgO(1
0
0). When the films are grown, the deposition beam is directed toward the substrate at non-normal incidence, to produce a rough outer surface, with anisotropic roughness. We measure the roughness induced in plane anisotropy fields for several samples with SMOKE, and we also perform STM measurements of the actual surface profile. This allows us to calculate the roughness induced in plane anisotropy produced by the dipolar mechanism, with no adjustable parameters, using the theory of Arias and Mills. Comparison between theory and experiment shows that anisotropy of dipolar origin is a major source of extrinsic in plane anisotropy.</description><identifier>ISSN: 0304-8853</identifier><identifier>DOI: 10.1016/S0304-8853(01)00016-6</identifier><identifier>CODEN: JMMMDC</identifier><language>eng</language><publisher>Amsterdam: Elsevier B.V</publisher><subject>Anisotropy ; Applied sciences ; Condensed matter: electronic structure, electrical, magnetic, and optical properties ; Exact sciences and technology ; Hysteresis loops ; Magnetic properties and materials ; Magnetic properties of monolayers and thin films ; Magnetic properties of surface, thin films and multilayers ; Metals. Metallurgy ; Physics ; SMOKE ; Surface roughness ; Ultrathin magnetic films</subject><ispartof>Journal of magnetism and magnetic materials, 2001, Vol.232 (1), p.36-45</ispartof><rights>2001 Elsevier Science B.V.</rights><rights>2001 INIST-CNRS</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c367t-c536eae4b10c7ebe9420ca621be93010e1dd02902f6a33e3fbd0dde5f843bd983</citedby><cites>FETCH-LOGICAL-c367t-c536eae4b10c7ebe9420ca621be93010e1dd02902f6a33e3fbd0dde5f843bd983</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,780,784,4021,27921,27922,27923</link.rule.ids><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=1030842$$DView record in Pascal Francis$$Hfree_for_read</backlink></links><search><creatorcontrib>Wolfe, J.H</creatorcontrib><creatorcontrib>Kawakami, R.K</creatorcontrib><creatorcontrib>Ling, W.L</creatorcontrib><creatorcontrib>Qiu, Z.Q</creatorcontrib><creatorcontrib>Arias, Rodrigo</creatorcontrib><creatorcontrib>Mills, D.L</creatorcontrib><title>Roughness induced in plane uniaxial anisotropy in ultrathin Fe films</title><title>Journal of magnetism and magnetic materials</title><description>We have studied roughness induced in plane anisotropy, for ultrathin Fe films grown on MgO(1
0
0). When the films are grown, the deposition beam is directed toward the substrate at non-normal incidence, to produce a rough outer surface, with anisotropic roughness. We measure the roughness induced in plane anisotropy fields for several samples with SMOKE, and we also perform STM measurements of the actual surface profile. This allows us to calculate the roughness induced in plane anisotropy produced by the dipolar mechanism, with no adjustable parameters, using the theory of Arias and Mills. Comparison between theory and experiment shows that anisotropy of dipolar origin is a major source of extrinsic in plane anisotropy.</description><subject>Anisotropy</subject><subject>Applied sciences</subject><subject>Condensed matter: electronic structure, electrical, magnetic, and optical properties</subject><subject>Exact sciences and technology</subject><subject>Hysteresis loops</subject><subject>Magnetic properties and materials</subject><subject>Magnetic properties of monolayers and thin films</subject><subject>Magnetic properties of surface, thin films and multilayers</subject><subject>Metals. Metallurgy</subject><subject>Physics</subject><subject>SMOKE</subject><subject>Surface roughness</subject><subject>Ultrathin magnetic films</subject><issn>0304-8853</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2001</creationdate><recordtype>article</recordtype><recordid>eNqFkE1PwzAMhnMAiTH4CUg9IASHgtO0WXtCaDBAmoTExzlKE5cFde2IW8T-Pek2IW6cbNmv_doPYyccLjlwefUCAtI4zzNxDvwCINRiucdGv-UDdkj0MTTSXI7Y7XPbvy8aJIpcY3uDNsRoVesGo75x-tvpOtKNo7bz7Wo9NPu687pbhGyGUeXqJR2x_UrXhMe7OGZvs7vX6UM8f7p_nN7MYyPkpItNJiRqTEsOZoIlFmkCRsuEh1QAB-TWQlJAUkktBIqqtGAtZlWeitIWuRizs-3elW8_e6ROLR0ZrIdr255UIosknRRFEGZbofEtkcdKrbxbar9WHNTASW04qQGIAq42nJQMc6c7A01G15XXjXH0Z1hAniZBdr2VYXj2y6FXZBw2AZ7zaDplW_eP0Q86O37P</recordid><startdate>2001</startdate><enddate>2001</enddate><creator>Wolfe, J.H</creator><creator>Kawakami, R.K</creator><creator>Ling, W.L</creator><creator>Qiu, Z.Q</creator><creator>Arias, Rodrigo</creator><creator>Mills, D.L</creator><general>Elsevier B.V</general><general>Elsevier Science</general><scope>IQODW</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SP</scope><scope>8FD</scope><scope>L7M</scope></search><sort><creationdate>2001</creationdate><title>Roughness induced in plane uniaxial anisotropy in ultrathin Fe films</title><author>Wolfe, J.H ; Kawakami, R.K ; Ling, W.L ; Qiu, Z.Q ; Arias, Rodrigo ; Mills, D.L</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c367t-c536eae4b10c7ebe9420ca621be93010e1dd02902f6a33e3fbd0dde5f843bd983</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2001</creationdate><topic>Anisotropy</topic><topic>Applied sciences</topic><topic>Condensed matter: electronic structure, electrical, magnetic, and optical properties</topic><topic>Exact sciences and technology</topic><topic>Hysteresis loops</topic><topic>Magnetic properties and materials</topic><topic>Magnetic properties of monolayers and thin films</topic><topic>Magnetic properties of surface, thin films and multilayers</topic><topic>Metals. Metallurgy</topic><topic>Physics</topic><topic>SMOKE</topic><topic>Surface roughness</topic><topic>Ultrathin magnetic films</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Wolfe, J.H</creatorcontrib><creatorcontrib>Kawakami, R.K</creatorcontrib><creatorcontrib>Ling, W.L</creatorcontrib><creatorcontrib>Qiu, Z.Q</creatorcontrib><creatorcontrib>Arias, Rodrigo</creatorcontrib><creatorcontrib>Mills, D.L</creatorcontrib><collection>Pascal-Francis</collection><collection>CrossRef</collection><collection>Electronics & Communications Abstracts</collection><collection>Technology Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>Journal of magnetism and magnetic materials</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Wolfe, J.H</au><au>Kawakami, R.K</au><au>Ling, W.L</au><au>Qiu, Z.Q</au><au>Arias, Rodrigo</au><au>Mills, D.L</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Roughness induced in plane uniaxial anisotropy in ultrathin Fe films</atitle><jtitle>Journal of magnetism and magnetic materials</jtitle><date>2001</date><risdate>2001</risdate><volume>232</volume><issue>1</issue><spage>36</spage><epage>45</epage><pages>36-45</pages><issn>0304-8853</issn><coden>JMMMDC</coden><abstract>We have studied roughness induced in plane anisotropy, for ultrathin Fe films grown on MgO(1
0
0). When the films are grown, the deposition beam is directed toward the substrate at non-normal incidence, to produce a rough outer surface, with anisotropic roughness. We measure the roughness induced in plane anisotropy fields for several samples with SMOKE, and we also perform STM measurements of the actual surface profile. This allows us to calculate the roughness induced in plane anisotropy produced by the dipolar mechanism, with no adjustable parameters, using the theory of Arias and Mills. Comparison between theory and experiment shows that anisotropy of dipolar origin is a major source of extrinsic in plane anisotropy.</abstract><cop>Amsterdam</cop><pub>Elsevier B.V</pub><doi>10.1016/S0304-8853(01)00016-6</doi><tpages>10</tpages></addata></record> |
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source | Elsevier:Jisc Collections:Elsevier Read and Publish Agreement 2022-2024:Freedom Collection (Reading list) |
subjects | Anisotropy Applied sciences Condensed matter: electronic structure, electrical, magnetic, and optical properties Exact sciences and technology Hysteresis loops Magnetic properties and materials Magnetic properties of monolayers and thin films Magnetic properties of surface, thin films and multilayers Metals. Metallurgy Physics SMOKE Surface roughness Ultrathin magnetic films |
title | Roughness induced in plane uniaxial anisotropy in ultrathin Fe films |
url | http://sfxeu10.hosted.exlibrisgroup.com/loughborough?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-14T11%3A26%3A11IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Roughness%20induced%20in%20plane%20uniaxial%20anisotropy%20in%20ultrathin%20Fe%20films&rft.jtitle=Journal%20of%20magnetism%20and%20magnetic%20materials&rft.au=Wolfe,%20J.H&rft.date=2001&rft.volume=232&rft.issue=1&rft.spage=36&rft.epage=45&rft.pages=36-45&rft.issn=0304-8853&rft.coden=JMMMDC&rft_id=info:doi/10.1016/S0304-8853(01)00016-6&rft_dat=%3Cproquest_cross%3E26924799%3C/proquest_cross%3E%3Cgrp_id%3Ecdi_FETCH-LOGICAL-c367t-c536eae4b10c7ebe9420ca621be93010e1dd02902f6a33e3fbd0dde5f843bd983%3C/grp_id%3E%3Coa%3E%3C/oa%3E%3Curl%3E%3C/url%3E&rft_id=info:oai/&rft_pqid=26924799&rft_id=info:pmid/&rfr_iscdi=true |