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Roughness induced in plane uniaxial anisotropy in ultrathin Fe films

We have studied roughness induced in plane anisotropy, for ultrathin Fe films grown on MgO(1 0 0). When the films are grown, the deposition beam is directed toward the substrate at non-normal incidence, to produce a rough outer surface, with anisotropic roughness. We measure the roughness induced in...

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Published in:Journal of magnetism and magnetic materials 2001, Vol.232 (1), p.36-45
Main Authors: Wolfe, J.H, Kawakami, R.K, Ling, W.L, Qiu, Z.Q, Arias, Rodrigo, Mills, D.L
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cited_by cdi_FETCH-LOGICAL-c367t-c536eae4b10c7ebe9420ca621be93010e1dd02902f6a33e3fbd0dde5f843bd983
cites cdi_FETCH-LOGICAL-c367t-c536eae4b10c7ebe9420ca621be93010e1dd02902f6a33e3fbd0dde5f843bd983
container_end_page 45
container_issue 1
container_start_page 36
container_title Journal of magnetism and magnetic materials
container_volume 232
creator Wolfe, J.H
Kawakami, R.K
Ling, W.L
Qiu, Z.Q
Arias, Rodrigo
Mills, D.L
description We have studied roughness induced in plane anisotropy, for ultrathin Fe films grown on MgO(1 0 0). When the films are grown, the deposition beam is directed toward the substrate at non-normal incidence, to produce a rough outer surface, with anisotropic roughness. We measure the roughness induced in plane anisotropy fields for several samples with SMOKE, and we also perform STM measurements of the actual surface profile. This allows us to calculate the roughness induced in plane anisotropy produced by the dipolar mechanism, with no adjustable parameters, using the theory of Arias and Mills. Comparison between theory and experiment shows that anisotropy of dipolar origin is a major source of extrinsic in plane anisotropy.
doi_str_mv 10.1016/S0304-8853(01)00016-6
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fullrecord <record><control><sourceid>proquest_cross</sourceid><recordid>TN_cdi_proquest_miscellaneous_26924799</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><els_id>S0304885301000166</els_id><sourcerecordid>26924799</sourcerecordid><originalsourceid>FETCH-LOGICAL-c367t-c536eae4b10c7ebe9420ca621be93010e1dd02902f6a33e3fbd0dde5f843bd983</originalsourceid><addsrcrecordid>eNqFkE1PwzAMhnMAiTH4CUg9IASHgtO0WXtCaDBAmoTExzlKE5cFde2IW8T-Pek2IW6cbNmv_doPYyccLjlwefUCAtI4zzNxDvwCINRiucdGv-UDdkj0MTTSXI7Y7XPbvy8aJIpcY3uDNsRoVesGo75x-tvpOtKNo7bz7Wo9NPu687pbhGyGUeXqJR2x_UrXhMe7OGZvs7vX6UM8f7p_nN7MYyPkpItNJiRqTEsOZoIlFmkCRsuEh1QAB-TWQlJAUkktBIqqtGAtZlWeitIWuRizs-3elW8_e6ROLR0ZrIdr255UIosknRRFEGZbofEtkcdKrbxbar9WHNTASW04qQGIAq42nJQMc6c7A01G15XXjXH0Z1hAniZBdr2VYXj2y6FXZBw2AZ7zaDplW_eP0Q86O37P</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>26924799</pqid></control><display><type>article</type><title>Roughness induced in plane uniaxial anisotropy in ultrathin Fe films</title><source>Elsevier:Jisc Collections:Elsevier Read and Publish Agreement 2022-2024:Freedom Collection (Reading list)</source><creator>Wolfe, J.H ; Kawakami, R.K ; Ling, W.L ; Qiu, Z.Q ; Arias, Rodrigo ; Mills, D.L</creator><creatorcontrib>Wolfe, J.H ; Kawakami, R.K ; Ling, W.L ; Qiu, Z.Q ; Arias, Rodrigo ; Mills, D.L</creatorcontrib><description>We have studied roughness induced in plane anisotropy, for ultrathin Fe films grown on MgO(1 0 0). When the films are grown, the deposition beam is directed toward the substrate at non-normal incidence, to produce a rough outer surface, with anisotropic roughness. We measure the roughness induced in plane anisotropy fields for several samples with SMOKE, and we also perform STM measurements of the actual surface profile. This allows us to calculate the roughness induced in plane anisotropy produced by the dipolar mechanism, with no adjustable parameters, using the theory of Arias and Mills. Comparison between theory and experiment shows that anisotropy of dipolar origin is a major source of extrinsic in plane anisotropy.</description><identifier>ISSN: 0304-8853</identifier><identifier>DOI: 10.1016/S0304-8853(01)00016-6</identifier><identifier>CODEN: JMMMDC</identifier><language>eng</language><publisher>Amsterdam: Elsevier B.V</publisher><subject>Anisotropy ; Applied sciences ; Condensed matter: electronic structure, electrical, magnetic, and optical properties ; Exact sciences and technology ; Hysteresis loops ; Magnetic properties and materials ; Magnetic properties of monolayers and thin films ; Magnetic properties of surface, thin films and multilayers ; Metals. Metallurgy ; Physics ; SMOKE ; Surface roughness ; Ultrathin magnetic films</subject><ispartof>Journal of magnetism and magnetic materials, 2001, Vol.232 (1), p.36-45</ispartof><rights>2001 Elsevier Science B.V.</rights><rights>2001 INIST-CNRS</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c367t-c536eae4b10c7ebe9420ca621be93010e1dd02902f6a33e3fbd0dde5f843bd983</citedby><cites>FETCH-LOGICAL-c367t-c536eae4b10c7ebe9420ca621be93010e1dd02902f6a33e3fbd0dde5f843bd983</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,780,784,4021,27921,27922,27923</link.rule.ids><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&amp;idt=1030842$$DView record in Pascal Francis$$Hfree_for_read</backlink></links><search><creatorcontrib>Wolfe, J.H</creatorcontrib><creatorcontrib>Kawakami, R.K</creatorcontrib><creatorcontrib>Ling, W.L</creatorcontrib><creatorcontrib>Qiu, Z.Q</creatorcontrib><creatorcontrib>Arias, Rodrigo</creatorcontrib><creatorcontrib>Mills, D.L</creatorcontrib><title>Roughness induced in plane uniaxial anisotropy in ultrathin Fe films</title><title>Journal of magnetism and magnetic materials</title><description>We have studied roughness induced in plane anisotropy, for ultrathin Fe films grown on MgO(1 0 0). When the films are grown, the deposition beam is directed toward the substrate at non-normal incidence, to produce a rough outer surface, with anisotropic roughness. We measure the roughness induced in plane anisotropy fields for several samples with SMOKE, and we also perform STM measurements of the actual surface profile. This allows us to calculate the roughness induced in plane anisotropy produced by the dipolar mechanism, with no adjustable parameters, using the theory of Arias and Mills. Comparison between theory and experiment shows that anisotropy of dipolar origin is a major source of extrinsic in plane anisotropy.</description><subject>Anisotropy</subject><subject>Applied sciences</subject><subject>Condensed matter: electronic structure, electrical, magnetic, and optical properties</subject><subject>Exact sciences and technology</subject><subject>Hysteresis loops</subject><subject>Magnetic properties and materials</subject><subject>Magnetic properties of monolayers and thin films</subject><subject>Magnetic properties of surface, thin films and multilayers</subject><subject>Metals. Metallurgy</subject><subject>Physics</subject><subject>SMOKE</subject><subject>Surface roughness</subject><subject>Ultrathin magnetic films</subject><issn>0304-8853</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2001</creationdate><recordtype>article</recordtype><recordid>eNqFkE1PwzAMhnMAiTH4CUg9IASHgtO0WXtCaDBAmoTExzlKE5cFde2IW8T-Pek2IW6cbNmv_doPYyccLjlwefUCAtI4zzNxDvwCINRiucdGv-UDdkj0MTTSXI7Y7XPbvy8aJIpcY3uDNsRoVesGo75x-tvpOtKNo7bz7Wo9NPu687pbhGyGUeXqJR2x_UrXhMe7OGZvs7vX6UM8f7p_nN7MYyPkpItNJiRqTEsOZoIlFmkCRsuEh1QAB-TWQlJAUkktBIqqtGAtZlWeitIWuRizs-3elW8_e6ROLR0ZrIdr255UIosknRRFEGZbofEtkcdKrbxbar9WHNTASW04qQGIAq42nJQMc6c7A01G15XXjXH0Z1hAniZBdr2VYXj2y6FXZBw2AZ7zaDplW_eP0Q86O37P</recordid><startdate>2001</startdate><enddate>2001</enddate><creator>Wolfe, J.H</creator><creator>Kawakami, R.K</creator><creator>Ling, W.L</creator><creator>Qiu, Z.Q</creator><creator>Arias, Rodrigo</creator><creator>Mills, D.L</creator><general>Elsevier B.V</general><general>Elsevier Science</general><scope>IQODW</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SP</scope><scope>8FD</scope><scope>L7M</scope></search><sort><creationdate>2001</creationdate><title>Roughness induced in plane uniaxial anisotropy in ultrathin Fe films</title><author>Wolfe, J.H ; Kawakami, R.K ; Ling, W.L ; Qiu, Z.Q ; Arias, Rodrigo ; Mills, D.L</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c367t-c536eae4b10c7ebe9420ca621be93010e1dd02902f6a33e3fbd0dde5f843bd983</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2001</creationdate><topic>Anisotropy</topic><topic>Applied sciences</topic><topic>Condensed matter: electronic structure, electrical, magnetic, and optical properties</topic><topic>Exact sciences and technology</topic><topic>Hysteresis loops</topic><topic>Magnetic properties and materials</topic><topic>Magnetic properties of monolayers and thin films</topic><topic>Magnetic properties of surface, thin films and multilayers</topic><topic>Metals. Metallurgy</topic><topic>Physics</topic><topic>SMOKE</topic><topic>Surface roughness</topic><topic>Ultrathin magnetic films</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Wolfe, J.H</creatorcontrib><creatorcontrib>Kawakami, R.K</creatorcontrib><creatorcontrib>Ling, W.L</creatorcontrib><creatorcontrib>Qiu, Z.Q</creatorcontrib><creatorcontrib>Arias, Rodrigo</creatorcontrib><creatorcontrib>Mills, D.L</creatorcontrib><collection>Pascal-Francis</collection><collection>CrossRef</collection><collection>Electronics &amp; Communications Abstracts</collection><collection>Technology Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>Journal of magnetism and magnetic materials</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Wolfe, J.H</au><au>Kawakami, R.K</au><au>Ling, W.L</au><au>Qiu, Z.Q</au><au>Arias, Rodrigo</au><au>Mills, D.L</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Roughness induced in plane uniaxial anisotropy in ultrathin Fe films</atitle><jtitle>Journal of magnetism and magnetic materials</jtitle><date>2001</date><risdate>2001</risdate><volume>232</volume><issue>1</issue><spage>36</spage><epage>45</epage><pages>36-45</pages><issn>0304-8853</issn><coden>JMMMDC</coden><abstract>We have studied roughness induced in plane anisotropy, for ultrathin Fe films grown on MgO(1 0 0). When the films are grown, the deposition beam is directed toward the substrate at non-normal incidence, to produce a rough outer surface, with anisotropic roughness. We measure the roughness induced in plane anisotropy fields for several samples with SMOKE, and we also perform STM measurements of the actual surface profile. This allows us to calculate the roughness induced in plane anisotropy produced by the dipolar mechanism, with no adjustable parameters, using the theory of Arias and Mills. Comparison between theory and experiment shows that anisotropy of dipolar origin is a major source of extrinsic in plane anisotropy.</abstract><cop>Amsterdam</cop><pub>Elsevier B.V</pub><doi>10.1016/S0304-8853(01)00016-6</doi><tpages>10</tpages></addata></record>
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subjects Anisotropy
Applied sciences
Condensed matter: electronic structure, electrical, magnetic, and optical properties
Exact sciences and technology
Hysteresis loops
Magnetic properties and materials
Magnetic properties of monolayers and thin films
Magnetic properties of surface, thin films and multilayers
Metals. Metallurgy
Physics
SMOKE
Surface roughness
Ultrathin magnetic films
title Roughness induced in plane uniaxial anisotropy in ultrathin Fe films
url http://sfxeu10.hosted.exlibrisgroup.com/loughborough?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-14T11%3A26%3A11IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Roughness%20induced%20in%20plane%20uniaxial%20anisotropy%20in%20ultrathin%20Fe%20films&rft.jtitle=Journal%20of%20magnetism%20and%20magnetic%20materials&rft.au=Wolfe,%20J.H&rft.date=2001&rft.volume=232&rft.issue=1&rft.spage=36&rft.epage=45&rft.pages=36-45&rft.issn=0304-8853&rft.coden=JMMMDC&rft_id=info:doi/10.1016/S0304-8853(01)00016-6&rft_dat=%3Cproquest_cross%3E26924799%3C/proquest_cross%3E%3Cgrp_id%3Ecdi_FETCH-LOGICAL-c367t-c536eae4b10c7ebe9420ca621be93010e1dd02902f6a33e3fbd0dde5f843bd983%3C/grp_id%3E%3Coa%3E%3C/oa%3E%3Curl%3E%3C/url%3E&rft_id=info:oai/&rft_pqid=26924799&rft_id=info:pmid/&rfr_iscdi=true