High-resolution electron microscopy investigations of stacking faults in Y1Ba2Cu3O(7-delta) metalorganic chemical vapor deposited thin films

New structural planar defects in Ba-deficient Y1Ba2Cu3O(7-delta) (YBCO) (1:1.6:3) thin films grown on NdGaO3 and SrTiO3 substrates by metalorganic chemical vapor deposition have been observed by means of high-resolution electron microscopy. The defects are associated with perturbations of the YBCO 1...

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Bibliographic Details
Published in:Journal of materials research 1999-07, Vol.14 (7), p.2732-2738
Main Authors: Grigis, Ch, Schamm, S, Dorignac, D
Format: Article
Language:English
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Summary:New structural planar defects in Ba-deficient Y1Ba2Cu3O(7-delta) (YBCO) (1:1.6:3) thin films grown on NdGaO3 and SrTiO3 substrates by metalorganic chemical vapor deposition have been observed by means of high-resolution electron microscopy. The defects are associated with perturbations of the YBCO 1:2:3 stacking sequences along the c direction, which give rise to structural variants with local 2:5:7, 3:4:7, or 4:6:10 cationic stoichiometries. The defects can be consistently interpreted as CuO-YO-CuO/CuO conversions or YO/BaO (BaO/YO) interconversions in the (a,b) planes and extending over a few nanometers along the c axis. Structural models based on image matching with simulations are proposed for two particular cases. It is thought that these structural imperfections can be effective sites of flux pinning. (Author)
ISSN:0884-2914