Growth and thermal stability of ultrathin films of Fe, Ni, Rh and Pd on the Ru(0001) surface

The growth and stability of ultrathin Fe, Ni, Rh and Pd films on the Ru(0001) surface was investigated in the temperature range of 200–2000 K. All films up to a material-dependent thickness agglomerated upon heating to T>600 K. At higher temperatures the films differ: Fe and Rh wet the surface ag...

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Bibliographic Details
Published in:Surface science 1999-03, Vol.423 (2), p.292-302
Main Authors: Kołaczkiewicz, J, Bauer, E
Format: Article
Language:English
Subjects:
Applied sciences
Auger electron spectroscopy
Condensed matter: structure, mechanical and thermal properties
Cross-disciplinary physics: materials science
rheology
Exact sciences and technology
Growth
Low energy electron diffraction (LEED)
Low index single crystal surfaces
Materials science
Metallic films
Metals. Metallurgy
Methods of deposition of films and coatings
film growth and epitaxy
Physics
Structure and morphology
thickness
Surfaces and interfaces
thin films and whiskers (structure and nonelectronic properties)
Thin film structure and morphology
Work function measurements
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Summary:The growth and stability of ultrathin Fe, Ni, Rh and Pd films on the Ru(0001) surface was investigated in the temperature range of 200–2000 K. All films up to a material-dependent thickness agglomerated upon heating to T>600 K. At higher temperatures the films differ: Fe and Rh wet the surface again by forming an interfacial alloy, Ni and Pd do not. This indicates that interfacial mixing is determined mainly by electronic rather than by elastic effects.
ISSN:0039-6028
1879-2758
DOI:10.1016/S0039-6028(98)00925-X