Multielement Analysis of Graphite and Silicon Carbide by Inductively Coupled Plasma Atomic Emission Spectrometry Using Solid Sampling and Electrothermal Vaporization

• Published in: Analytical chemistry (Washington) 1999-02, Vol.71 (4), p.849-854
• Main Authors: Schäffer, Uwe, Krivan, Viliam
• Format: Article
• Language: English
• Subjects: Analytical chemistry; Chemistry; Exact sciences and technology; Graphite; Plasma; Scientific imaging; Spectrometric and optical methods
• ISSN: 0003-2700; 1520-6882
• DOI: 10.1021/ac980821a

An improved graphite furnace electrothermal vaporization device, equipped with an autosampler system for precise and almost contamination-free introduction of solid samples, was used for the simultaneous determination of Al, Ag, As, Bi, Ca, Co, Cr, Cu, Fe, Ga, K, Li, Mg, Na, Ni, and Pb in graphite and silicon carbide by inductively coupled plasma atomic emission spectrometry. The volatilization of most analytes could be significantly improved by addition of Freon 1,2 to the argon carrier gas. Calibration was performed using aqueous standard solutions. Owing to the extremely low blanks, large applicable sample portions (up to 16 mg), high transport efficiency, and the addition of Freon 1,2, extraordinarily low limits of detection in the range 5−250 ng/g were achieved. The accuracy was checked by comparison of the results with those obtained by various other methods. For most analytes in both matrixes, the comparison led to very good agreement of the results.