Morphology of alumina: a comparison between infrared spectroscopy and X-ray diffractometry

Morphology of three samples of alumina are investigated. Infrared spectra are analysed by use of their morphology through the theory of average dielectric constant. Crystal shape is obtained from X-ray diffraction patterns by reflection intensity ratio. In the case of electron scanning microscopy, s...

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Bibliographic Details
Published in:Journal of non-crystalline solids 1999-01, Vol.247 (1), p.227-231
Main Authors: Varanda, L.C., Jafelicci Jr, M., Magnani, R., Davolos, M.R., Sigoli, F.A., Marques, R.F.C., Godoi, R.H.M.
Format: Article
Language:English
Subjects:
Cross-disciplinary physics: materials science
rheology
Exact sciences and technology
Materials science
Methods of crystal growth
physics of crystal growth
Physics
Theory and models of crystal growth
physics of crystal growth, crystal morphology and orientation
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Summary:Morphology of three samples of alumina are investigated. Infrared spectra are analysed by use of their morphology through the theory of average dielectric constant. Crystal shape is obtained from X-ray diffraction patterns by reflection intensity ratio. In the case of electron scanning microscopy, shape factor was obtained by an average axial ratio of the particles. Comparison of results show that there is agreement among these techniques and infrared spectra can be used to determine the morphology of alumina particles from 2.7 to 10 μm, even for heterogeneous samples.
ISSN:0022-3093
1873-4812
DOI:10.1016/S0022-3093(99)00075-7