Thermal transients in microwave active devices and their influence on intermodulation distortion

A fully physical transient thermal model is used to investigate the effects of temperature on the intermodulation distortion performance of microwave devices. A 24mm, 60 finger pHEMT is used to compared measurements with predictions from the model. Results are in very good agreement and are a strong...

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Bibliographic Details
Main Authors: David, Stephane, Batty, William, Panks, Andrew J, Johnson, Robert G, Snowden, Christopher M
Format: Conference Proceeding
Language:English
Online Access:Get full text
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Summary:A fully physical transient thermal model is used to investigate the effects of temperature on the intermodulation distortion performance of microwave devices. A 24mm, 60 finger pHEMT is used to compared measurements with predictions from the model. Results are in very good agreement and are a strong indication of thermally induced intermodulation distortion.
ISSN:0149-645X