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Emitter series resistance effect of multiple heterojunction contacts for Pnp heterojunction bipolar transistors
For InP-based Pnp heterojunction bipolar transistors (HBTs), a set of epitaxial layers, frequently incorporating quaternaries, is used to make a low resistance electrical contact to the emitter layer. We describe an analytical approach to investigate the nonlinear effects of the multiple heterojunct...
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Published in: | Solid-state electronics 1999, Vol.43 (7), p.1299-1305 |
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Main Authors: | , , |
Format: | Article |
Language: | English |
Citations: | Items that this one cites Items that cite this one |
Online Access: | Get full text |
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Summary: | For InP-based Pnp heterojunction bipolar transistors (HBTs), a set of epitaxial layers, frequently incorporating quaternaries, is used to make a low resistance electrical contact to the emitter layer. We describe an analytical approach to investigate the nonlinear effects of the multiple heterojunction interfaces on the emitter series resistance and emitter junction current–voltage characteristics of the device. The simulation results show that heterojunction interfaces can contribute a substantial portion (up to 20%) to the total emitter series resistance, especially at high levels of emitter current. |
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ISSN: | 0038-1101 1879-2405 |
DOI: | 10.1016/S0038-1101(99)00117-3 |