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Anisotropic roughness effects of magnetoresistive hysteresis in scratched NiO spin valves

Magnetoresistance (MR), exchange biasing, and coercivity of NiO/NiFe/Cu/NiFe spin valves, deposited over etched glass, scratched glass, and Si 3N 4 buffer layers were measured in order to investigate the effect of roughness slope and anisotropic roughness at the NiO/NiFe interface. It was found that...

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Bibliographic Details
Published in:Journal of magnetism and magnetic materials 1999-06, Vol.198, p.39-42
Main Authors: Hwang, Do-Guwn, Lee, Sang-Suk, Park, Chang-Man
Format: Article
Language:English
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Summary:Magnetoresistance (MR), exchange biasing, and coercivity of NiO/NiFe/Cu/NiFe spin valves, deposited over etched glass, scratched glass, and Si 3N 4 buffer layers were measured in order to investigate the effect of roughness slope and anisotropic roughness at the NiO/NiFe interface. It was found that the MR ratio and the biasing field were not influenced by etching and scratching the substrate. This was due to a constant value of the average slope of roughness, despite an increased rms roughness. In the case of samples with Si 3N 4 buffer layer, the MR ratio and exchange biasing field increased due to an increasing slope or roughness. The coercive field of the unbiased NiFe layer was reduced by perpendicular scratching. This was probably due to refinement of the magnetic domains.
ISSN:0304-8853
DOI:10.1016/S0304-8853(98)00612-X