Photothermal modulation of laser diode wavelength: application to sinusoidal phase-modulating interferometer for displacement measurements

In this paper, a novel laser-diode (LD) sinusoidal phase-modulating (SPM) interferometer, which utilizes a photothermal technique for LD wavelength modulation, is proposed to measure displacements with a nanometer accuracy. In conventional LD–SPM interferometers, the LD intensity modulation is concu...

Full description

Saved in:
Bibliographic Details
Published in:Optics and laser technology 1999-11, Vol.31 (8), p.559-564
Main Authors: Wang, Xuefeng, Wang, Xiangzhao, Qian, Feng, Chen, Gang, Chen, Gaoting, Fang, Zujie
Format: Article
Language:English
Subjects:
Interferometer
Optical testing
Photothermal effect
Citations: Items that this one cites
Items that cite this one
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Summary:In this paper, a novel laser-diode (LD) sinusoidal phase-modulating (SPM) interferometer, which utilizes a photothermal technique for LD wavelength modulation, is proposed to measure displacements with a nanometer accuracy. In conventional LD–SPM interferometers, the LD intensity modulation is concurrent with the wavelength modulation, which increases measurement errors. Using the photothermal technique, the LD wavelength modulation can be accomplished with negligible concomitant intensity modulation, and the measurement errors are thus eliminated. The computer simulations and experiment results verify the usefulness of this novel interferometer.
ISSN:0030-3992
1879-2545
DOI:10.1016/S0030-3992(99)00114-0