Dependence of inertial measurements of distance on accelerometer noise

Accelerometers are widely used in many applications to determine position. An investigation is made into the errors in estimated position that are caused by noise and drift effects in stationary accelerometers. An analytical study is made into the effects of biases in the accelerometer data and the...

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Bibliographic Details
Published in:Measurement science & technology 2002-08, Vol.13 (8), p.1163-1172, Article 301
Main Authors: Thong, Y K, Woolfson, M S, Crowe, J A, Hayes-Gill, B R, Challis, R E
Format: Article
Language:English
Subjects:
Applied sciences
Electronics
Exact sciences and technology
Measurements common to several branches of physics and astronomy
Metrology, measurements and laboratory procedures
Micro- and nanoelectromechanical devices (mems/nems)
Physics
Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices
Velocity, acceleration and rotation
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Summary:Accelerometers are widely used in many applications to determine position. An investigation is made into the errors in estimated position that are caused by noise and drift effects in stationary accelerometers. An analytical study is made into the effects of biases in the accelerometer data and the effects of changing the cut-off frequency in the anti-aliasing filter. The root mean square errors in position are calculated as a function of time and sampling frequency. A comparison is made between the theoretical results and experimental data taken from 2 commercial accelerometers. Recommendations are made regarding the calibration of accelerometers prior to their use in practical situations. (Original abstract - amended)
ISSN:0957-0233
1361-6501
DOI:10.1088/0957-0233/13/8/301