Optical ellipsometry (polarization) measurements on alkyl ammonium metal complexes

The refractive indices and thicknesses of thin-film Langmuir-Blodgett (LB) films are determined using spectroscopic ellipsometry techniques. By incorporating the spectrometer to a charge-coupled detector, extensive and rapid collection of data is achieved. The data for each film are obtained by anal...

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Bibliographic Details
Published in:Journal of materials science letters 1999, Vol.18 (13), p.1037-1038
Main Authors: HARIYADI, LOVETT, D. R, SMITH, S. R. P
Format: Article
Language:English
Subjects:
Condensed matter: electronic structure, electrical, magnetic, and optical properties
Exact sciences and technology
Optical constants (including refractive index, complex dielectric constant, absorption, reflection and transmission coefficients, emissivity)
Optical constants: refractive index, complex dielectric constant, absorption, reflection and transmission coefficients, emissivity
Optical properties and condensed-matter spectroscopy and other interactions of matter with particles and radiation
Optical properties of bulk materials and thin films
Physics
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Summary:The refractive indices and thicknesses of thin-film Langmuir-Blodgett (LB) films are determined using spectroscopic ellipsometry techniques. By incorporating the spectrometer to a charge-coupled detector, extensive and rapid collection of data is achieved. The data for each film are obtained by analysis as a function of angle of the incident light. The results indicated that the technique is an accurate method for obtaining both layer thickness and refractive index of such films and can be successfully used to gather information where there are a number of layers of different media.
ISSN:0261-8028
DOI:10.1023/A:1006675526758