High-power performance of single-mode fiber-optic connectors

We measured the continuous wave (CW) laser-induced damage threshold of single-mode fiber-optic connectors at 1550 nm. Clean standard physical contact and angled physical contact connectors did not show any evidence of damage for 10 min exposures of 1 W or 3 W. Defective connectors with scratched or...

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Bibliographic Details
Published in:Journal of lightwave technology 2002-05, Vol.20 (5), p.879-885
Main Authors: de Rosa, M., Carberry, J., Bhagavatula, V., Wagner, K., Saravanos, C.
Format: Article
Language:English
Subjects:
Connectors
Contact
Contact angle
Contacts
Contamination
Dielectric breakdown
Dielectric materials
Failure
Fiber lasers
Fiber optics
Impurities
Laser theory
Optical fibers
Optical materials
Power lasers
Stimulated emission
Thresholds
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Summary:We measured the continuous wave (CW) laser-induced damage threshold of single-mode fiber-optic connectors at 1550 nm. Clean standard physical contact and angled physical contact connectors did not show any evidence of damage for 10 min exposures of 1 W or 3 W. Defective connectors with scratched or undercut endfaces showed identical high-power tolerance as clean connectors without defects. Samples contaminated with carbon black-doped acrylate showed drastic optical failure signatures at approximately 50 mW. Contaminated connectors with expanded mode field diameters ranging from 20 to 62 /spl mu/m showed higher failure thresholds than standard connectors with 10-/spl mu/m spot sizes. We observed that the optical failure threshold power level (P/sub failure/) increased linearly with spot size for the highly contaminated connectors used in this study.
ISSN:0733-8724
1558-2213
DOI:10.1109/JLT.2002.1007944