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High-power performance of single-mode fiber-optic connectors

We measured the continuous wave (CW) laser-induced damage threshold of single-mode fiber-optic connectors at 1550 nm. Clean standard physical contact and angled physical contact connectors did not show any evidence of damage for 10 min exposures of 1 W or 3 W. Defective connectors with scratched or...

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Published in:	Journal of lightwave technology 2002-05, Vol.20 (5), p.879-885
Main Authors:	de Rosa, M., Carberry, J., Bhagavatula, V., Wagner, K., Saravanos, C.
Format:	Article
Language:	English
Subjects:	Connectors Contact Contact angle Contacts Contamination Dielectric breakdown Dielectric materials Failure Fiber lasers Fiber optics Impurities Laser theory Optical fibers Optical materials Power lasers Stimulated emission Thresholds
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container_title	Journal of lightwave technology
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creator	de Rosa, M. Carberry, J. Bhagavatula, V. Wagner, K. Saravanos, C.
description	We measured the continuous wave (CW) laser-induced damage threshold of single-mode fiber-optic connectors at 1550 nm. Clean standard physical contact and angled physical contact connectors did not show any evidence of damage for 10 min exposures of 1 W or 3 W. Defective connectors with scratched or undercut endfaces showed identical high-power tolerance as clean connectors without defects. Samples contaminated with carbon black-doped acrylate showed drastic optical failure signatures at approximately 50 mW. Contaminated connectors with expanded mode field diameters ranging from 20 to 62 /spl mu/m showed higher failure thresholds than standard connectors with 10-/spl mu/m spot sizes. We observed that the optical failure threshold power level (P/sub failure/) increased linearly with spot size for the highly contaminated connectors used in this study.
doi_str_mv	10.1109/JLT.2002.1007944
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Clean standard physical contact and angled physical contact connectors did not show any evidence of damage for 10 min exposures of 1 W or 3 W. Defective connectors with scratched or undercut endfaces showed identical high-power tolerance as clean connectors without defects. Samples contaminated with carbon black-doped acrylate showed drastic optical failure signatures at approximately 50 mW. Contaminated connectors with expanded mode field diameters ranging from 20 to 62 /spl mu/m showed higher failure thresholds than standard connectors with 10-/spl mu/m spot sizes. We observed that the optical failure threshold power level (P/sub failure/) increased linearly with spot size for the highly contaminated connectors used in this study.</description><identifier>ISSN: 0733-8724</identifier><identifier>EISSN: 1558-2213</identifier><identifier>DOI: 10.1109/JLT.2002.1007944</identifier><identifier>CODEN: JLTEDG</identifier><language>eng</language><publisher>New York: IEEE</publisher><subject>Connectors ; Contact ; Contact angle ; Contacts ; Contamination ; Dielectric breakdown ; Dielectric materials ; Failure ; Fiber lasers ; Fiber optics ; Impurities ; Laser theory ; Optical fibers ; Optical materials ; Power lasers ; Stimulated emission ; Thresholds</subject><ispartof>Journal of lightwave technology, 2002-05, Vol.20 (5), p.879-885</ispartof><rights>Copyright The Institute of Electrical and Electronics Engineers, Inc. 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We observed that the optical failure threshold power level (P/sub failure/) increased linearly with spot size for the highly contaminated connectors used in this study.</description><subject>Connectors</subject><subject>Contact</subject><subject>Contact angle</subject><subject>Contacts</subject><subject>Contamination</subject><subject>Dielectric breakdown</subject><subject>Dielectric materials</subject><subject>Failure</subject><subject>Fiber lasers</subject><subject>Fiber optics</subject><subject>Impurities</subject><subject>Laser theory</subject><subject>Optical fibers</subject><subject>Optical materials</subject><subject>Power lasers</subject><subject>Stimulated emission</subject><subject>Thresholds</subject><issn>0733-8724</issn><issn>1558-2213</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2002</creationdate><recordtype>article</recordtype><recordid>eNqNkU1Lw0AQhhdRsFbvgpfgQbykzuxusrvgRYqfFLzU85KPSU1Js3E3Rfz3pqQH8SCe5jDP-8LMw9g5wgwRzM3LYjnjAHyGAMpIecAmmCQ65hzFIZuAEiLWistjdhLCGgCl1GrCbp_q1XvcuU_yUUe-cn6TtQVFropC3a4aijeupKiqc_Kx6_q6iArXtlT0zodTdlRlTaCz_Zyyt4f75fwpXrw-Ps_vFnHBje5jw3nKAQUqLBQkptQ8BQEpmgRLCZCqLBdJRjJHyGSZ6sxAKUmmSZVWudFiyq7G3s67jy2F3m7qUFDTZC25bbBcC4ka_gEqlIDJDrz-E0QQyI1RaAb08he6dlvfDvdaraVMNR9-O2UwQoV3IXiqbOfrTea_hia782MHP3bnx-79DJGLMVIT0Q983H4D7Q-IQQ</recordid><startdate>200205</startdate><enddate>200205</enddate><creator>de Rosa, M.</creator><creator>Carberry, J.</creator><creator>Bhagavatula, V.</creator><creator>Wagner, K.</creator><creator>Saravanos, C.</creator><general>IEEE</general><general>The Institute of Electrical and Electronics Engineers, Inc. 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Clean standard physical contact and angled physical contact connectors did not show any evidence of damage for 10 min exposures of 1 W or 3 W. Defective connectors with scratched or undercut endfaces showed identical high-power tolerance as clean connectors without defects. Samples contaminated with carbon black-doped acrylate showed drastic optical failure signatures at approximately 50 mW. Contaminated connectors with expanded mode field diameters ranging from 20 to 62 /spl mu/m showed higher failure thresholds than standard connectors with 10-/spl mu/m spot sizes. We observed that the optical failure threshold power level (P/sub failure/) increased linearly with spot size for the highly contaminated connectors used in this study.</abstract><cop>New York</cop><pub>IEEE</pub><doi>10.1109/JLT.2002.1007944</doi><tpages>7</tpages></addata></record>
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subjects	Connectors Contact Contact angle Contacts Contamination Dielectric breakdown Dielectric materials Failure Fiber lasers Fiber optics Impurities Laser theory Optical fibers Optical materials Power lasers Stimulated emission Thresholds
title	High-power performance of single-mode fiber-optic connectors
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