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Asymmetry of the remagnetization processes in exchange-biased NiFe/NiO bilayers

The magnetization reversal of NiFe/NiO exchange-coupled films with direct (NiFe/NiO) and inverse (NiO/NiFe) deposition ordering of the ferro- and antiferromagnetic layers onto the MgO substrate were investigated by means of the magneto-optical indicator film technique and vibrating sample magnetomet...

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Bibliographic Details
Published in:Journal of magnetism and magnetic materials 1999-06, Vol.198, p.500-502
Main Authors: Nikitenko, V.I, Gornakov, V.S, Dedukh, L.M, Khapikov, A.F, Shapiro, A.J, Shull, R.D, Chaiken, A
Format: Article
Language:English
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Summary:The magnetization reversal of NiFe/NiO exchange-coupled films with direct (NiFe/NiO) and inverse (NiO/NiFe) deposition ordering of the ferro- and antiferromagnetic layers onto the MgO substrate were investigated by means of the magneto-optical indicator film technique and vibrating sample magnetometry. Processes of the domain formation and growth as well as the magnitude of the macroscopic coercive force were found to depend drastically on the growth order. Moreover all of our bilayers were characterized by an asymmetry in the activity of crystal lattice defects as domain wall nucleation centers. The results are discussed in terms of variations in the real crystal structure of the antiferromagnetic layer.
ISSN:0304-8853
DOI:10.1016/S0304-8853(98)01197-4