Features of moiré patterns in HPHT-grown diamond single crystals

• Published in: Materials letters 2002, Vol.52 (3), p.187-191
• Main Authors: Yin, Long-Wei, Li, Mu-Sen, Sunm, Dong-Sheng, Zou, Zeng-Da, Liu, Yu-Xian, Hao, Zhao-Yin
• Format: Article
• Language: English
• Subjects: Condensed matter: structure, mechanical and thermal properties; Defects and impurities in crystals; microstructure; Diamond single crystals; Direct observation of dislocations and other defects (etch pits, decoration, electron microscopy, x-ray topography, etc.); Exact sciences and technology; High temperature–high pressure growth; Moiré image; Physics; Stacking faults; Stacking-fault tetrahedral; Structure of solids and liquids; crystallography; Twins
• ISSN: 0167-577X; 1873-4979
• DOI: 10.1016/S0167-577X(01)00390-1

Diamond single crystal particles, which were grown at high temperature–high pressure (HPHT) in the presence of FeNi catalyst, have been successfully examined by cross-sectional transmission electron microscopy (TEM). Structure defects in the HPHT-grown diamonds can be interpreted by moiré fringe images. It was shown by moiré fringe images that there exist stacking faults, stacking-fault tetrahedral, twins and concentric dislocation loops in the HPHT-grown diamonds. Some stacking faults terminating on intersecting twin boundary suggest that the Shockley partial dislocations react with the twins on the (111) pane. The stacking faults, twins and stacking-fault tetrahedral derive from the supersaturated vacancies in the HPHT-grown diamonds. The concentric dislocation loops and fringe distortions in the moiré images may result from the internal stresses associated with the inclusions in the diamonds.