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IC identification circuit using device mismatch
Non-alterable identification is required for tracking work in progress, detecting part rebranding, radio frequency identification (RFID), IP protection, and transaction validation. Wafer-level techniques such as laser link cutting, and circuit-level EPROM techniques, require expensive machinery or s...
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| Published in: | 2000 IEEE International Solid-State Circuits Conference. Digest of Technical Papers (Cat. No.00CH37056) 2000, p.372-373 |
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| Main Authors: | , , |
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| Language: | English |
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| cited_by | cdi_FETCH-LOGICAL-c166t-4808c64904bf60ef32f33cc5d243edad476f92b37564212ce84835a21561f91b3 |
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| container_end_page | 373 |
| container_issue | |
| container_start_page | 372 |
| container_title | 2000 IEEE International Solid-State Circuits Conference. Digest of Technical Papers (Cat. No.00CH37056) |
| container_volume | |
| creator | Lofstrom, K. Daasch, W.R. Taylor, D. |
| description | Non-alterable identification is required for tracking work in progress, detecting part rebranding, radio frequency identification (RFID), IP protection, and transaction validation. Wafer-level techniques such as laser link cutting, and circuit-level EPROM techniques, require expensive machinery or special wafer processing. Integrated circuit identification (ICID) extracts unique and repeatable information from the randomness inherent in silicon processing. No external programming or special process steps are needed, and the technique may be used with any standard submicron CMOS process. |
| doi_str_mv | 10.1109/ISSCC.2000.839821 |
| format | article |
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No external programming or special process steps are needed, and the technique may be used with any standard submicron CMOS process.</description><subject>Circuit testing</subject><subject>Intrusion detection</subject><subject>Logic devices</subject><subject>Logic testing</subject><subject>MOSFETs</subject><subject>Radiofrequency identification</subject><subject>Silicon</subject><subject>Transistors</subject><subject>Voltage</subject><issn>0193-6530</issn><issn>2376-8606</issn><isbn>0780358538</isbn><isbn>9780780358539</isbn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2000</creationdate><recordtype>article</recordtype><sourceid>6IE</sourceid><recordid>eNotkMtOwzAURC0eEm3hA2CVFbuk1762Yy9RxCNSJRaFdeQ612DUJiVOkPh7IpXVbM4cjYaxWw4F52DX9XZbVYUAgMKgNYKfsYXAUudGgz5nSygNoDIKzQVbALeYa4VwxZYpfc0lZbVZsHVdZbGlbowhejfGvst8HPwUx2xKsfvIWvqJnrJDTAc3-s9rdhncPtHNf67Y-9PjW_WSb16f6-phk3uu9ZhLA8ZraUHuggYKKAKi96oVEql1rSx1sGKHpdJScOHJSIPKCa40D5bvcMXuT97j0H9PlMZmXuBpv3cd9VNqRCm4tVLM4N0JjETUHId4cMNvczoE_wBVr1Dt</recordid><startdate>2000</startdate><enddate>2000</enddate><creator>Lofstrom, K.</creator><creator>Daasch, W.R.</creator><creator>Taylor, D.</creator><general>IEEE</general><scope>6IE</scope><scope>6IH</scope><scope>CBEJK</scope><scope>RIE</scope><scope>RIO</scope><scope>7U5</scope><scope>8FD</scope><scope>L7M</scope></search><sort><creationdate>2000</creationdate><title>IC identification circuit using device mismatch</title><author>Lofstrom, K. ; Daasch, W.R. ; Taylor, D.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c166t-4808c64904bf60ef32f33cc5d243edad476f92b37564212ce84835a21561f91b3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2000</creationdate><topic>Circuit testing</topic><topic>Intrusion detection</topic><topic>Logic devices</topic><topic>Logic testing</topic><topic>MOSFETs</topic><topic>Radiofrequency identification</topic><topic>Silicon</topic><topic>Transistors</topic><topic>Voltage</topic><toplevel>online_resources</toplevel><creatorcontrib>Lofstrom, K.</creatorcontrib><creatorcontrib>Daasch, W.R.</creatorcontrib><creatorcontrib>Taylor, D.</creatorcontrib><collection>IEEE Electronic Library (IEL) Conference Proceedings</collection><collection>IEEE Proceedings Order Plan (POP) 1998-present by volume</collection><collection>IEEE Xplore All Conference Proceedings</collection><collection>IEEE Xplore</collection><collection>IEEE Proceedings Order Plans (POP) 1998-present</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>Technology Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>2000 IEEE International Solid-State Circuits Conference. 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| identifier | ISSN: 0193-6530 |
| ispartof | 2000 IEEE International Solid-State Circuits Conference. Digest of Technical Papers (Cat. No.00CH37056), 2000, p.372-373 |
| issn | 0193-6530 2376-8606 |
| language | eng |
| recordid | cdi_proquest_miscellaneous_27219942 |
| source | IEEE Electronic Library (IEL) Conference Proceedings |
| subjects | Circuit testing Intrusion detection Logic devices Logic testing MOSFETs Radiofrequency identification Silicon Transistors Voltage |
| title | IC identification circuit using device mismatch |
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