Characterization of Verneuil red corundum by X-ray topography

Half boules of industrial red corundum (Al 2O 3) synthesized by the Verneuil process were cut into slices (about 1 mm thick) crosswise or lengthwise to the growth axis of the samples. All the slices were analysed by optical microscopy, energy dispersive spectrometry (EDS) and by X-ray transmission t...

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Bibliographic Details
Published in:Materials chemistry and physics 2000-10, Vol.66 (2), p.143-148
Main Authors: Rinaudo, C, Orione, P
Format: Article
Language:English
Subjects:
Corundum
Cross-disciplinary physics: materials science
rheology
Crystal quality
EDS
Exact sciences and technology
Growth from solutions
Materials science
Methods of crystal growth
physics of crystal growth
Physics
Verneuil
X-ray transmission topography
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Summary:Half boules of industrial red corundum (Al 2O 3) synthesized by the Verneuil process were cut into slices (about 1 mm thick) crosswise or lengthwise to the growth axis of the samples. All the slices were analysed by optical microscopy, energy dispersive spectrometry (EDS) and by X-ray transmission topography. The samples turned out to be single crystals only at the bottom of the boule, corresponding to the initial stages of the growth. From the middle part of the boule considerable deformations leading to a macromosaic crystal were observed. In all of the examined samples the deformation vector showed a major component along a direction normal to the growth axis of the boule.
ISSN:0254-0584
1879-3312
DOI:10.1016/S0254-0584(00)00340-0