Changes in surface stress at the liquid/solid interface measured with a microcantilever

The bending of microfabricated silicon nitride cantilevers was used to determine surface stress changes at solid–liquid interfaces. The radius of curvature of the bent cantilever is directly proportional to changes in the differential surface stress between its opposite sides. To demonstrate the pos...

Full description

Saved in:
Bibliographic Details
Published in:Electrochimica acta 2000-11, Vol.46 (2), p.157-163
Main Authors: Raiteri, R., Butt, H.-J., Grattarola, M.
Format: Article
Language:English
Subjects:
Atomic force microscopy
Biosensors
Cantilevers
Chemistry
Exact sciences and technology
General and physical chemistry
Solid-liquid interface
Surface energy of solids
Surface physical chemistry
Surface stress
Citations: Items that this one cites
Items that cite this one
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Summary:The bending of microfabricated silicon nitride cantilevers was used to determine surface stress changes at solid–liquid interfaces. The radius of curvature of the bent cantilever is directly proportional to changes in the differential surface stress between its opposite sides. To demonstrate the possibilities and limitations of the technique, cantilevers coated on both sides with gold and densely packed monolayers of different thiols were put in a constant flow of aqueous electrolyte solution and the deflection was measured using a optical lever technique. Changes in the surface stress for the different thiol monolayers due to specific proton adsorption are presented. Possible applications and improvements of this technique are discussed.
ISSN:0013-4686
1873-3859
DOI:10.1016/S0013-4686(00)00569-7