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Fast and stable Fourier ptychographic microscopy based on improved phase recovery strategy

Fourier ptychographic microscopy (FPM) imaging is a computational imaging technology that can reconstruct wide-field high-resolution (HR) images. It uses a series of low-resolution images captured by a camera under different illumination angles. The images are stitched in the Fourier domain to expan...

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Bibliographic Details
Published in:Optics express 2022-05, Vol.30 (11), p.18505-18517
Main Authors: Luo, Jiaxiong, Tan, Haishu, Chen, Hanbao, Zhu, Sicong, Li, Jiancong, Wu, Ruofei, Wu, Yanxiong
Format: Article
Language:English
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Summary:Fourier ptychographic microscopy (FPM) imaging is a computational imaging technology that can reconstruct wide-field high-resolution (HR) images. It uses a series of low-resolution images captured by a camera under different illumination angles. The images are stitched in the Fourier domain to expand their spectral range. Under high-angle illumination, a dark-field image is noisy with a low signal-to-noise ratio, which significantly reduces the reconstruction quality of FPM. Conventional reconstruction algorithms often have low FPM imaging performance and efficiency due to optimization strategies. In response to these problems, this paper proposes an FPM imaging method based on an improved phase recovery strategy to optimize the alternating iterative algorithm. The technique uses an improved threshold method to reduce noise in the image preprocessing stage to maximize the retention of high-frequency sample information. Moreover, an adaptive control factor is added in the subsequent iterative update process to balance the sample spectrum function. This study verifies the effectiveness of the proposed method on both simulation and experimental images. The results show that the proposed method can effectively suppress image background noise and has a faster convergence speed and higher robustness. In addition, it can be used to reconstruct HR complex amplitude images of objects under wide field-of-view conditions.
ISSN:1094-4087
1094-4087
DOI:10.1364/OE.454615