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A new fabrication process for metallic point contacts
We present a new process to fabricate metallic point contacts. The key feature of this process is the use of a Si membrane. Advantages of the process are i) the possibility to fabricate very small holes (down to 10 nm diameter), while the lithographic resolution requirements are modest, ii) the poss...
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Published in: | Microelectronic engineering 1997-02, Vol.35 (1-4), p.317-320 |
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Main Authors: | , , , |
Format: | Article |
Language: | English |
Citations: | Items that this one cites Items that cite this one |
Online Access: | Get full text |
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Summary: | We present a new process to fabricate metallic point contacts. The key feature of this process is the use of a Si membrane. Advantages of the process are i) the possibility to fabricate very small holes (down to 10 nm diameter), while the lithographic resolution requirements are modest, ii) the possibility to fine-tune the size of the hole by thermal oxidation and iii) probably a better controlled filling of the hole due to its tapered shape and its sharp edge. From electrical transport measurements it follows that the process yields highly ballistic point contacts. |
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ISSN: | 0167-9317 1873-5568 |
DOI: | 10.1016/S0167-9317(96)00141-4 |