The structural characterization of Co-Cu(100) superlattices by X-ray absorption spectroscopy

Extended X-ray absorption fine structure has been used to determine a crystallographic distortion in the cobalt layers in Co-Cu single-crystal superlattices grown on Cu(100). The fcc structure of the superlattice imposed by the copper substrate is distorted along the growing direction for the Co lay...

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Bibliographic Details
Published in:Journal of physics. Condensed matter 1994-07, Vol.6 (27), p.4981-4990
Main Authors: Castaner, R, Prieto, C, Andres, A de, Martinez, J L, Martinez-Albertos, J L, Ocal, C, Miranda, R
Format: Article
Language:English
Subjects:
Applied sciences
Condensed matter: structure, mechanical and thermal properties
Exact sciences and technology
Low-dimensional structures (superlattices, quantum well structures, multilayers): structure, and nonelectronic properties
Metals. Metallurgy
Physics
Structure of solids and liquids
crystallography
Surfaces and interfaces
thin films and whiskers (structure and nonelectronic properties)
X-ray absorption spectroscopy: exafs, nexafs, xanes, etc
X-ray diffraction and scattering
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Summary:Extended X-ray absorption fine structure has been used to determine a crystallographic distortion in the cobalt layers in Co-Cu single-crystal superlattices grown on Cu(100). The fcc structure of the superlattice imposed by the copper substrate is distorted along the growing direction for the Co layers, which are compressed perpendicularly to the interfaces. They adopt the in-plane lattice constant of the Cu substrate, keeping constant the atomic volume of Co (11.30 Angstrom exp 3 /atom), close to the value for hcp-Co.
ISSN:0953-8984
1361-648X
DOI:10.1088/0953-8984/6/27/007