Characterization of SiC whiskers

The composition and microstructure of SiC whiskers from three different suppliers were studied to understand their physical and chemical properties. The following analytical methods were utilized: complete chemical analysis, morphological examination by scanning electron microscopy and by high-resol...

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Bibliographic Details
Published in:Journal of materials science 1995-01, Vol.30 (14), p.3734-3745
Main Authors: FREVEL, L. K, SAHA, C. K, PETERSEN, D. R
Format: Article
Language:English
Subjects:
Condensed matter: structure, mechanical and thermal properties
Exact sciences and technology
Physics
Surfaces and interfaces
thin films and whiskers (structure and nonelectronic properties)
Whiskers and dendrites (growth,structure, and nonelectronic properties)
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Summary:The composition and microstructure of SiC whiskers from three different suppliers were studied to understand their physical and chemical properties. The following analytical methods were utilized: complete chemical analysis, morphological examination by scanning electron microscopy and by high-resolution transmission electron microscopy, selected-area electron diffraction, x-ray diffraction, and thermogravimetric analysis of the oxidation rate of the three SiC whiskers at 1050 deg C in oxygen and at 1150 deg C in air.
ISSN:0022-2461
1573-4803
DOI:10.1007/BF00351892