Characterization of SiC whiskers

The composition and microstructure of SiC whiskers from three different suppliers were studied to understand their physical and chemical properties. The following analytical methods were utilized: complete chemical analysis, morphological examination by scanning electron microscopy and by high-resol...

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Published in:Journal of materials science 1995-01, Vol.30 (14), p.3734-3745
Main Authors: FREVEL, L. K, SAHA, C. K, PETERSEN, D. R
Format: Article
Language:English
Subjects:
Condensed matter: structure, mechanical and thermal properties
Exact sciences and technology
Physics
Surfaces and interfaces
thin films and whiskers (structure and nonelectronic properties)
Whiskers and dendrites (growth,structure, and nonelectronic properties)
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description The composition and microstructure of SiC whiskers from three different suppliers were studied to understand their physical and chemical properties. The following analytical methods were utilized: complete chemical analysis, morphological examination by scanning electron microscopy and by high-resolution transmission electron microscopy, selected-area electron diffraction, x-ray diffraction, and thermogravimetric analysis of the oxidation rate of the three SiC whiskers at 1050 deg C in oxygen and at 1150 deg C in air.
doi_str_mv 10.1007/BF00351892
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subjects Condensed matter: structure, mechanical and thermal properties
Exact sciences and technology
Physics
Surfaces and interfaces
thin films and whiskers (structure and nonelectronic properties)
Whiskers and dendrites (growth,structure, and nonelectronic properties)
title Characterization of SiC whiskers
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