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A study of different ageing classes via total time on test transform and Lorenz curves

A device subject to shocks occurring randomly according to a general counting process and failing when the cumulative damage exceeds a fixed threshold is considered. Sufficient conditions for the lifetime of this device belonging to the HNBUE class are given and as a consequence a procedure to obtai...

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Bibliographic Details
Published in:Applied stochastic models and data analysis 1997-09, Vol.13 (3-4), p.241-248
Main Authors: Pérez-Ocón, Rafael, Gámiz-Pérez, M. Luz, Ruíz-Castro, J. Eloy
Format: Article
Language:English
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Summary:A device subject to shocks occurring randomly according to a general counting process and failing when the cumulative damage exceeds a fixed threshold is considered. Sufficient conditions for the lifetime of this device belonging to the HNBUE class are given and as a consequence a procedure to obtain an HNBUE sample is performed. A computational program is implemented to obtain an HNBUE sample. Moreover, another computational program has been implemented to check whether these values belong to a smaller class than HNBUE by means of known graphic procedures, namely Lorenz and TTT curves. © 1998 John Wiley & Sons, Ltd.
ISSN:8755-0024
1099-0747
DOI:10.1002/(SICI)1099-0747(199709/12)13:3/4<241::AID-ASM318>3.0.CO;2-D