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A study of different ageing classes via total time on test transform and Lorenz curves
A device subject to shocks occurring randomly according to a general counting process and failing when the cumulative damage exceeds a fixed threshold is considered. Sufficient conditions for the lifetime of this device belonging to the HNBUE class are given and as a consequence a procedure to obtai...
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Published in: | Applied stochastic models and data analysis 1997-09, Vol.13 (3-4), p.241-248 |
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Main Authors: | , , |
Format: | Article |
Language: | English |
Subjects: | |
Online Access: | Get full text |
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Summary: | A device subject to shocks occurring randomly according to a general counting process and failing when the cumulative damage exceeds a fixed threshold is considered. Sufficient conditions for the lifetime of this device belonging to the HNBUE class are given and as a consequence a procedure to obtain an HNBUE sample is performed. A computational program is implemented to obtain an HNBUE sample. Moreover, another computational program has been implemented to check whether these values belong to a smaller class than HNBUE by means of known graphic procedures, namely Lorenz and TTT curves. © 1998 John Wiley & Sons, Ltd. |
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ISSN: | 8755-0024 1099-0747 |
DOI: | 10.1002/(SICI)1099-0747(199709/12)13:3/4<241::AID-ASM318>3.0.CO;2-D |