Automated diagnosis in testing and failure analysis

To meet market demands for the rapid introduction of new semiconductor products, automated means of diagnosing defective silicon are fast becoming mandatory. The introduction and use of automated diagnosis (AD) at Texas Instruments for two recent products, the TMS320C80 MVP parallel-processing DSP,...

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Bibliographic Details
Published in:IEEE design & test of computers 1997-01, Vol.13 (3), p.83-89
Main Authors: Butler, Kenneth M, Johnson, Karl, Platt, Jeff, Kinra, Anjali, Saxena, Jayashree
Format: Article
Language:English
Online Access:Get full text
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Summary:To meet market demands for the rapid introduction of new semiconductor products, automated means of diagnosing defective silicon are fast becoming mandatory. The introduction and use of automated diagnosis (AD) at Texas Instruments for two recent products, the TMS320C80 MVP parallel-processing DSP, and the UltraSparc-I microprocessor is discussed and presented. The two primary goals of automated diagnosis are to decrease the time required to perform electrical failure isolation and to decrease the number of unresolved failures. Other aspects of AD is also presented which includes the possible use of a production tester for diagnosis, creation of alternative debugging environments, and the development of additional software tools.
ISSN:0740-7475