Loading…

Microstructural evolution of NiFe/Ag multilayers studied by X-ray diffraction and in situ high-resolution TEM

X-ray diffraction and in situ high-resolution electron microscopy experiments have been performed to study the effect of annealing on the microstructure of permalloy/silver multilayers. Both techniques show that the silver diffuses into the permalloy grain boundaries creating so-called ‘silver bridg...

Full description

Saved in:
Bibliographic Details
Published in:Journal of magnetism and magnetic materials 1995-11, Vol.151 (1), p.24-32
Main Authors: Snoeck, E., Sinclair, R., Parker, M.A., Hylton, T.L., Coffey, K.R., Howard, J.K., Lessmann, A., Bienenstock, A.I.
Format: Article
Language:English
Subjects:
Citations: Items that this one cites
Items that cite this one
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Summary:X-ray diffraction and in situ high-resolution electron microscopy experiments have been performed to study the effect of annealing on the microstructure of permalloy/silver multilayers. Both techniques show that the silver diffuses into the permalloy grain boundaries creating so-called ‘silver bridges’. This bridging is expected to be responsible for the giant magnetoresistance effect observed at low fields in these devices. Moreover, unexpected permalloy diffusion and recrystallization have also been observed in the in situ TEM experiments.
ISSN:0304-8853
DOI:10.1016/0304-8853(95)00409-2